Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Fluorescence lifespan measuring device for obtaining two or more fluorescence lifespan components by calculating, through virtual fluorescence distribution model, least square error from signals collected by analog average delay method, and measuring method therefor

A fluorescence lifetime, measuring device technology, applied in measuring devices, material analysis by optical means, fluorescence/phosphorescence, etc., can solve the problems of signal loss, short fluorescence lifetime, difficulty in measuring fluorescence lifetime independently, etc. The effect of measuring speed

Inactive Publication Date: 2019-08-02
IND ACADEMIC COOP FOUND YONSEI UNIV +1
View PDF2 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this case, signal loss occurs, so the measured fluorescence lifetime becomes shorter than the actual value
[0006] Furthermore, when a large number of samples with two or more fluorescence lifetimes different from each other are mixed, it is difficult to measure each fluorescence lifetime independently even with a single photon

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fluorescence lifespan measuring device for obtaining two or more fluorescence lifespan components by calculating, through virtual fluorescence distribution model, least square error from signals collected by analog average delay method, and measuring method therefor
  • Fluorescence lifespan measuring device for obtaining two or more fluorescence lifespan components by calculating, through virtual fluorescence distribution model, least square error from signals collected by analog average delay method, and measuring method therefor
  • Fluorescence lifespan measuring device for obtaining two or more fluorescence lifespan components by calculating, through virtual fluorescence distribution model, least square error from signals collected by analog average delay method, and measuring method therefor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] The advantages and features of the present disclosure and a method of achieving the advantages and features will become apparent by referring to the embodiments described in detail below in conjunction with the accompanying drawings. However, this disclosure may be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. Accordingly, the scope of the present disclosure is to be limited only by the appended claims.

[0018] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Also, terms (such as those defined in commonly used dictionaries) should not be interpreted in an idealized or overly formal sense u...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A fluorescence lifespan measuring device according to one embodiment of the present invention comprises: an irradiation light generating unit for generating irradiation light; a fluorescence photon detection unit for collecting fluorescence signals of fluorescence photons generated by irradiating, with the irradiation light, at least one sample including fluorescence molecules; and a measuring unit for calculating fluorescence lifespan by using a least square method for a function of the collected fluorescence signals and a simulation function.

Description

technical field [0001] The present invention relates to a fluorescence lifetime measurement device and method for measuring fluorescence lifetime, and more particularly to a fluorescence lifetime measurement device and method capable of independently measuring two or more mixed samples in a minimum time. Background technique [0002] Microscopes are classified into first-generation optical microscopes, second-generation electron microscopes, and third-generation scanning probe microscopes, and are widely used in medical science, molecular biology, new drug development, and material engineering. [0003] More recently, however, fluorescence lifetime microscopy has come to the center of research. Fluorescence lifetime microscopy is an instrument capable of measuring fluorescence resonance energy transfer (FRET) most accurately (FLIM-FRET). FRET is a phenomenon in which energy is transferred from one phosphor to another without emission or absorption of light when the two phos...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/64G01J1/44
CPCG01J1/44G01J2001/446G01N21/6458G01N21/6408G01N21/6486G01J2001/4453G01J2001/4466G01N21/6402
Inventor 金德泳黄元商金东垠姜珉求
Owner IND ACADEMIC COOP FOUND YONSEI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com