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Spectral on-line diagnosis method and device

A diagnostic device and a diagnostic method, which are applied in the field of optical technology and applications, can solve problems such as poor application effects of excitation spectrum online measurement systems, and achieve the effects of simple structure, wide measurement temperature range, and improved signal-to-noise ratio

Inactive Publication Date: 2019-06-07
NORTHWEST INST OF NUCLEAR TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In order to solve the problem that the existing excitation spectrum online measurement system has poor application effect at high temperature, the present invention proposes a new spectrum online diagnosis method and device

Method used

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  • Spectral on-line diagnosis method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0031] see figure 1 , the sample 1 to be tested and the integrating sphere 6 receiving the optical signal are respectively placed at the focal point A and the focal point B of the conjugate reflective surface. The heating laser 4 is transmitted through the light window 15 to heat the sample 1, so that the sample reaches a state of high temperature / high heating rate; at the same time, the whole system can be placed in a vacuum or filled with different gases to achieve different atmospheres. During the temperature rise process, the monochromatic light after being separated by the monochromator or the Raman excitation light is used as the probe light 2 , which is incident on the sample through the light window 14 . The probe light is reflected or Raman-scattered by the sample surface, and the reflected light or Raman-scattered light 3 is converged by the conjugate reflective surface 5 and then enters the focal point B. At the focal point B, the integrating sphere 6 is used to co...

Embodiment 2

[0034] see figure 2 , the principle and system structure of Embodiment 2 are basically the same as Embodiment 1. The main difference is that instead of using laser heating, the method of heating the back of the sample is changed, that is, a heater 12 is arranged on the back of the sample. The specific heating principle can be It is electric furnace, resistance type, induction heating and other methods. Correspondingly, there is no need to set a light window 15, and it is also not necessary to install an optical filter 10 in front of the spectral signal detector.

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Abstract

The invention provides a spectrum on-line diagnosis method and device. The problem of poor application effect of an existing excitation spectrum on-line measurement system in a high-temperature stateis solved. The spectrum on-line diagnosis method comprises the following steps that (1) a conjugate reflecting surface is established, and a sample and a detection assembly are placed at a focal pointA and a focal point B of the conjugate reflecting surface separately; (2) the sample is heated to realize high temperature / high temperature rate conditions; and (3) detection light is incident to thesurface of the sample to generate reflection or Raman scattering, the reflection or Raman scattering light is reflected and converged by the conjugate reflection surface and then is incident to the focal point B and enters the detection assembly, spectral signals are received and detected, and a reflection or scattering spectral curve of the surface of the sample in the temperature change processis calculated and given. The spectrum on-line diagnosis method and device has the characteristics of real-time online, high test precision, pollution resistance, simple structure and the like.

Description

technical field [0001] The invention belongs to the field of optical technology and application, and relates to a spectrum online diagnosis method and device. Background technique [0002] The analysis of material spectral reflectance and scattering characteristics is the main method to study and obtain the information of material composition and microstructure. Changes in the microstructure of materials are the basis for changes in their physical and chemical properties. The study of changes in spectral reflection and scattering characteristics during material damage or modification is of great significance for damage mechanism research and preparation process improvement. The usual practice is to conduct offline spectral testing and analysis, such as Raman spectroscopy, infrared spectroscopy, fluorescence spectroscopy, etc. Offline analysis cannot detect material composition and microstructure under variable temperature conditions. [0003] The existing online analysis of...

Claims

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Application Information

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IPC IPC(8): G01N21/31G01N21/25G01N21/64G01N21/65G01N21/01
Inventor 吴丽雄冯国斌吕玉伟吴涛涛
Owner NORTHWEST INST OF NUCLEAR TECH
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