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Anti-counterfeiting film

A technology of anti-counterfeiting film and film stack, applied in the field of anti-counterfeiting film, can solve the problems of high cost and difficult production process of anti-counterfeiting film, etc.

Active Publication Date: 2019-04-09
ZHANGJIAGANG KANGDE XIN OPTRONICS MATERIAL
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The main purpose of the present invention is to provide an anti-counterfeit film to solve the problems of difficult production process and high cost of the anti-counterfeit film in the prior art

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0085] Simulation experiment data:

[0086] A PET layer with a thickness of 0.05 mm is used as the transparent substrate layer. A film stack of an anti-reflection layer and an anti-counterfeiting pattern layer (a layer of high refractive index material and a layer of low refractive index material cross-stacked) is set on the PET layer, wherein the shape of the film stack is set to "KDX", and the film stack The hollowed-out gaps are filled with PET, the central wavelength of the incident light is set to 532nm, the high refractive index material layer is a titanium dioxide layer with a refractive index of 2.354, and the low refractive index material layer is a silicon dioxide layer with a refractive index of 1.46. The transparent layer is composed of a titanium dioxide layer and a silicon dioxide layer with an optical thickness of λ / 4, and the optical thickness coefficient of the anti-counterfeiting pattern layer is designed as:

[0087] 第一半膜堆:0.216H 1.836L 0.303H 1.691L 0.377H...

Embodiment 2

[0092] The two half-film stacks of the anti-counterfeiting film corresponding to Example 1 were fabricated by using the magnetron sputtering process, and the substrate was cleaned with a clean cloth and ethanol. Design the mask plate with clearance "KDX".

[0093] After degassing the vacuum chamber, use a vacuum cleaner to clean the inside of the bell jar, fill the molybdenum boat with the film material to be evaporated, and record the name of the film material of each boat. And place the substrate on the substrate holder, do not tilt the substrate, and place the mask plate on the cleaned substrate. Drop the bell jar and evacuate the vacuum chamber according to the operation rules of the coating machine. When the vacuum reaches 7×10 -3 After Pa, pre-melt the film material in the molybdenum boat in turn to remove the gas in the film material. At this time, pay attention to block the film material with a baffle to ensure that the substrate will not be plated during pre-meltin...

Embodiment 3

[0096] Simulation experiment data:

[0097] The optical thickness coefficient of the high-refractive index material layer and the optical thickness coefficient of the low-refractive index material layer of the film system are the same as in Example 1, and the two half-film stacks are arranged on two opposite surfaces of the PET layer. Using the Essential Macleod film system design software, from the vertical direction to the anti-counterfeiting film and the direction with an angle of 30° to the anti-counterfeiting film as the observation angle, the light reflection performance of the above-mentioned anti-counterfeiting film is simulated respectively. The simulation results are shown in Figure 7 and Table 1.

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Abstract

The invention provides an anti-counterfeiting film. Anti-counterfeiting pattern layers of the anti-counterfeiting film comprise hollowed out refractive material parts; each hollowed out refractive material part comprises at least one film stack with a film structure of |(alpha<1> H beta<1> L alpha<2> H beta<2> L...alpha<m> H beta<m> L)|, wherein H is used for representing a high refractive index layer, L is used for representing a low refractive index, n and m are positive integers, 3<n<=150, 3<m<=50, m<=n, in a same film stack, alpha<1>, alpha<2>, ..., alpha<m> and beta<m>, ..., beta <2>, andbeta <1> are capable of satisfying a same grading change rule of a same cosine wave or sinusoidal wave pattern independently, according to the i th high and low refractive index units alpha H beta L, alpha is used for representing the optical thickness of the i th high refractive index material layer accounts for alpha times of lambda / 4; and beta is used for representing the optical thickness of the i th low refractive index material layer accounts for beta times of lambda / 4, lambda is used for representing monitoring wavelength, and the reflection wavelength of the anti-counterfeiting film ranges from 380 to 700nm. Low cost counterfeiting is achieved.

Description

technical field [0001] The invention relates to the field of optical film structures, in particular to an anti-counterfeit film. Background technique [0002] At present, there are mainly three types of anti-counterfeiting marks popular in the market: one is printed with special ink and needs to be identified by special instruments or detection means; [0003] The second is to use anti-counterfeiting codes and query through anti-counterfeiting telephones or the Internet; [0004] The third is to make a holographic anti-counterfeiting mark through laser holographic imaging. [0005] The above-mentioned use of anti-counterfeiting codes and holographic anti-counterfeiting marks is costly, but the current ink printing method has a single anti-counterfeiting function, is easy to identify and imitate, so the fidelity is not strong. [0006] The anti-counterfeiting method of ink printing is to use the optical effects of colorants, such as based on the composition of colorant lame...

Claims

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Application Information

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IPC IPC(8): G09F3/02
CPCG09F3/0294G09F2003/0257
Inventor 于甄张国臻夏振
Owner ZHANGJIAGANG KANGDE XIN OPTRONICS MATERIAL
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