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Joint test platform middleware plug-in device and its test resource information interaction method

A test platform and resource information technology, which is applied to the joint test platform middleware plug-in device and the field of test resource information interaction, can solve problems such as computer memory resource consumption, and achieve the effects of improving commonality, reducing consumption, and enhancing flexibility

Active Publication Date: 2021-04-02
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] In order to solve the problem that the customized architecture of the existing joint test platform middleware plug-in enables all test resources to use the same plug-in for information interaction, causing serious consumption of computer memory resources, the present invention proposes a joint test platform middleware plug-in device and its test resource information interactive method

Method used

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  • Joint test platform middleware plug-in device and its test resource information interaction method

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specific Embodiment approach 1

[0051] Specific implementation mode one: combine figure 1 , figure 2 , image 3 , Figure 4 , Figure 5 , Figure 6 , Figure 7 , Figure 8 Describe this embodiment, the joint test platform middleware plug-in device provided in this embodiment includes: object model implementation file 1 and plug-in adapter 2, such as figure 1 shown;

[0052] Under the middleware plug-in device flexible assembly architecture, the middleware plug-in device is divided into object model implementation files 1 (such as figure 2 shown) and plug-in adapter 2 (as image 3 shown) two parts, usually a plug-in adapter 2 connects multiple object model implementation files 1.

[0053] The object model implementation file 1 is provided with an object model implementation file facet 3, an object model implementation file socket 4 and a DDS interface 5, and DDS is a data distribution service; the plug-in adapter 2 is provided with an event slot 6 and an event source 7 , plug-in adapter socket 8 a...

specific Embodiment approach 2

[0191] Embodiment 2: This embodiment differs from Embodiment 1 in that the test resource information includes object instance information and object model information.

[0192] Other steps and parameters are the same as those in the first embodiment.

specific Embodiment approach 3

[0193] Embodiment 3: This embodiment differs from Embodiment 1 or Embodiment 2 in that the object instance information includes object instance name, object instance data type, and object instance data.

[0194] Other steps and parameters are the same as those in Embodiment 1 or 2.

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Abstract

The invention provides a combined test platform middleware plug-in and a test resource information interaction method thereof, and belongs to the technical field of components. The combined test platform middleware plug-in comprises an object model realization file and a plug-in adaptor; an object model realization file facet, an object model realization file socket and a DDS interface are formedin the object model realization file; the plug-in adaptor is provided with an event groove, an event source, a plug-in adaptor socket and a plug-in adaptor facet. The method includes the processes oftest resource information issuing and test resource information purchasing. The problem is solved that an existing combined test platform middleware plug-in is of a customized structure, and all testresources adopt the same plug-in for information interaction, so that a large quantity of memory resources of a computer are wasted. The method can be used for combined test platform test resource information interaction.

Description

technical field [0001] The invention relates to a joint test platform middleware plug-in device and a method for exchanging test resource information, and belongs to the technical field of components. Background technique [0002] The middleware of the joint test platform is responsible for all communication during the establishment and operation of the entire system application. It belongs to the public facilities of the joint test platform and provides a high-performance, low-latency data environment between test system resources and provides management and control functions for the comprehensive test system application. [0003] Component technology is based on object-oriented technology and has developed object-oriented technology very well. Its purpose is to encapsulate the object, including its user interface, external interface and other attributes, as well as the function realization of the object into a standardized, standard whole that can be easily manipulated and...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F9/451G06F9/445G06F8/30G06F8/35
CPCG06F8/315G06F8/35G06F9/44526G06F9/451
Inventor 杨京礼高天宇姜守达
Owner HARBIN INST OF TECH
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