Accelerated aging test system for semiconductor component

Abstract

The invention discloses an accelerated aging test system for a semiconductor component. The test system is composed of a central control module, an HAST test box and a multi-channel data acquisition module, wherein the HAST test box and the multi-channel data acquisition module are in communication connection with the central control module through universal control buses. The HAST test box consists of a high-temperature high-humidity test box and a to-be-tested component support plate arranged inside the high-temperature high-humidity test box; a to-be-tested component is welded to the support plate and is outputted to a multi-channel signal adapter plate by cooperating with the HAST test box in a signal manner. The multi-channel signal adapter plate is connected to the multi-channel dataacquisition module. According to the invention, the system is suitable for the HAST reliability test experiments of various semiconductor components; and the service lives of the paster packaging andplug-in element can be verified under actual welding condition simulation. The self-developed control program of the central control module can set the temperature and humidity test conditions of theHAST test box as well as the voltage loaded to the to-be-tested semiconductor component by the power supply module; data transmitted by the multi-channel data acquisition module can be recorded instantly; the data can be analyzed to output the volt-ampere characteristic icon, so that the experimental technician can carry out analysis and comparison conveniently.

Description

technical field [0001] The invention relates to a reliability test, which is a semiconductor element accelerated aging test system capable of performing accelerated aging experiments on various semiconductor elements. Background technique [0002] Reliability testing, which is defined as testing the length of time a product can maintain to complete specified functions under specified conditions, the longer the time, the higher the reliability. Reliability testing originated in the space defense armament industry during the Cold War. With the end of the Cold War, the application field of reliability testing has gradually expanded from space defense to general civilian industries, industrial automation products, scientific instruments, medical equipment, automobile industry, modern commercial application products. In particular, industrial automation products and communication networks are developing rapidly, with complex and changeable functions, more chances of failure, and...

AI Technical Summary

Problems solved by technology

Although domestic and foreign manufacturers can provide complete data collection and communication transmission solutions, there is no ready-made product case for integrating a HAST test box for a complete HAST experiment

Because it involves equipment integration, unified communication protocol, database maintenance, man-machine operation platform compilation, the development investment is huge, and the program of large-scale laboratories is too professional, and the maintenance operation is very inconvenient

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