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Depth learning based smart instrument detection method

A technology of instrument detection and deep learning, applied in instruments, measuring devices, measuring electrical variables, etc., can solve problems such as equipment failure, safety, and data error instruments, and achieve the effect of avoiding failures, ensuring personnel safety, and having a high degree of intelligence.

Active Publication Date: 2018-10-09
方汝松
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Problems solved by technology

[0004] In view of the above problems, the present invention proposes an intelligent instrument detection method based on deep learning, which effectively solves the safety problems, data error problems and instrument or equipment failure problems caused by the lack of self-testing of existing industrial instruments

Method used

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  • Depth learning based smart instrument detection method
  • Depth learning based smart instrument detection method

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Embodiment Construction

[0031] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0032] A kind of overall structure that realizes the detection system of the present invention is made up of 4 parts of data reading unit, data storage unit, data analysis and processing unit, predictive warning unit, as figure 1 shown.

[0033] The functions of each unit are as follows:

[0034] (1) The data reading unit adopts machine vision technology, takes pictures of the instrument reading interface through the camera to obtain the required image, and then after image processing, uses image digital recognition technology to read the reading indicated by the instrument.

[0035] (2) The data storage unit is mainly used to store the detection data of related equipment, including: the instrument data read by the reading unit, the historical data of the read instrument, and other detection data.

[0036] (3) The data analysis and processing unit performs ...

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Abstract

The invention discloses a depth learning based smart instrument detection method. The method includes taking a picture of an instrument through a camera, performing preprocessing on the image throughan IPC and reading instrument numerical value through image number recognition technology; performing analysis on the read instrument numerical value data and making result prediction and judgment; sending an instrument change alarm if instrument damage is judged through analysis and taking corresponding halt treatment; sending an alarm and stopping equipment operation immediately if the instrument works normally but the numerical value surpasses a safety range of the instrument; performing smart learning on history data and previous judgment and returning to the system, improving data analysis and system pre-judgment continuously, improving the pre-judgment accuracy through uninterrupted machine self learning. The method provided by the invention has advantages of high smart level and good pre-judgment capability. Besides, the pre-judgment method is improved continuously through history data and history judgment and the smart pre-judgment capability is improved.

Description

technical field [0001] The invention relates to the application of machine vision and deep learning technology in the field of instrument monitoring, in particular to an intelligent instrument detection method based on deep learning. Background technique [0002] With the development of machine vision technology, image recognition is increasingly used in industry, military and daily life. As an emerging discipline, machine vision is developing very rapidly. Deep learning is a branch of machine learning. Its purpose is to establish a neural network that simulates the human brain for analysis and learning, and to process data by imitating the working mechanism of the human brain. [0003] In the modern industrial environment, many instruments and computers are already connected, but these connections are usually the same type or related instruments connected to the cabinet. These cabinets are sometimes placed on the measurement site due to technical reasons, so this kind of ...

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Application Information

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IPC IPC(8): G01R35/02
CPCG01R35/02
Inventor 方汝松朱雷穆科明
Owner 方汝松
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