Testing system, testing method and testing clamp for electromagnetic parameters of graphene material

Abstract

The invention relates to a testing system, method and clamp for electromagnetic parameters of a graphene material. The system comprises a testing clamp, a vector network analyzer and a data processingdevice, wherein the testing clamp comprises an outer clamp and an embedded type clamp arranged in the outer clamp; the outer clamp is provided with a reflection testing port and a transmission testing port, which are connected with the vector network analyzer; the embedded type clamp is used for clamping a graphene material testing sample; the vector network analyzer is used for measuring scattering parameters of end connection surfaces of the reflection testing port and the transmission testing port of the outer clamp; the data processing device is used for carrying out phase compensation onthe scattering parameters of the end connection surfaces of the reflection testing port and the transmission testing port, so as to obtain scattering parameters of an end face of the graphene material testing sample and calculating to obtain complex magnetic conductivity and / or a complex dielectric constant of the graphene material. According to the system provided by the invention, the embeddedtype clamp is additionally arranged in the outer clamp and is used for preventing a thin-layer sample from being damaged in a clamping process; the electromagnetic parameters of the graphene materialunder a thin-layer state can be measured to obtain more accurate measurement data.

Description

technical field [0001] The invention relates to the technical field of microwave material dielectric characteristic measurement, in particular to a graphene material electromagnetic parameter test system, test method and test fixture. Background technique [0002] Graphene is a carbon atom with sp 2 A new two-dimensional carbon material in which hybrid orbitals form a hexagonal lattice; single-layer graphene is only one atomic layer thick, and is the thinnest and hardest material known in the world. Single-layer graphene is almost completely transparent, with an absorption rate of only 2.3%, and an in-plane thermal conductivity as high as 5300W / (m·k), which is higher than all known materials in the world. Its electron mobility exceeds 1500cm at room temperature 2 / (V·s), while the resistivity is only 10 -8 Ω·m, which is lower than that of highly conductive metals such as copper or silver. Due to its π electron network, graphene can provide good conduction channels for el...

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a graphene material electromagnetic parameter test system, test method and test fixture for the defects that the general test fixtures and methods in the prior art are not suitable for the measurement of graphene thin layer materials

Images