Resistance simulation device based on multiplication-type digital-to-analog converter

A digital-to-analog converter and analog device technology, applied in simulators, instruments, power supply testing, etc., can solve the problem of high price and the number of bits generally does not exceed 16 bits, lack of processing measures to eliminate system errors, and poor resistance resolution. Advanced problems, to achieve the effect of a wide range of analog resistance values, fast circuit response speed, and high resolution

Active Publication Date: 2018-07-06
CHANGZHOU TONGHUI ELECTRONICS
View PDF12 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The circuit can quickly realize constant resistance simulation through hardware, but due to the use of digital potentiometers, the number of digits is limited, resulting in low resolution of the resistance that can be simulated; high-end digital potentiometers are expensive and the number of digits generally does not exceed 16, making The applicability of the scheme is poor; there are no measures to eliminate system errors, and there are no restrictions on the amplitude of the drive circuit, which will easily lead to overload of the power tube, cause circuit oscillation, and cause system instability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Resistance simulation device based on multiplication-type digital-to-analog converter
  • Resistance simulation device based on multiplication-type digital-to-analog converter
  • Resistance simulation device based on multiplication-type digital-to-analog converter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] The present invention will now be further described in conjunction with the accompanying drawings and preferred embodiments. These drawings are all simplified schematic diagrams, which only illustrate the basic structure of the present invention in a schematic manner, so they only show the configurations related to the present invention.

[0021] like image 3 As shown, a resistance analog device based on a multiplying digital-to-analog converter in this embodiment includes a digital signal processor DSP, an isolator, a multiplying digital-to-analog converter, an inverter, a comparison unit 3, a PID unit 2, Limiting unit 1, driving circuit 5, power tube, sampling resistor, differential amplifier, amplifier, attenuator, follower, digital ground, analog ground and external test power supply, digital signal processor DSP is connected to the isolator with digital ground as reference On one side, the other side of the isolator is connected to the input terminal of the multi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a resistance simulation device based on a multiplying type digital-to-analog converter, which comprises a digital signal processor DSP, an isolator, a multiplying digital-to-analog converter, an inverter, a comparison unit, a PID unit, a limiting unit and a driving circuit, a power transistor, a sampling resistor, a differential amplifier, an amplifier, an attenuator, a follower, a digital ground, an analog ground and external test power supplies. The invention constructs a fast and high-resolution resistance value simulation system with a multiplicative digital-to-analog converter as the core, adopts a PID link to eliminate the error generated by the system, and increases the limiting circuit to prevent the power tube from entering a dead zone or an overload, thereby realizing an accurate resistance. The simulation has high resolution, wide range of analog resistance values, fast circuit response, stable circuit parameters, low price and high reliability. According to the invention, a fast and high-resolution resistance value simulation system is built by taking a multiplying digital-to-analog converter as a core, errors generated by the system are eliminated by adopting a PID link, the limiting circuit is added to prevent the power tube from entering a dead zone or an overload, the analog resistance value range is wide, the circuit reaction speed is fast, the circuit parameter is stable, the price is low, and the reliability is high.

Description

technical field [0001] The invention relates to a DC electronic load, in particular to a resistance simulation device based on a multiplying digital-to-analog converter. Background technique [0002] Traditional constant resistance simulation methods, such as figure 1 As shown, in the electronic load, the single-chip microcomputer usually controls the current loop or the voltage loop, changes the load current, thereby changes the output voltage and thus changes the resistance value, and realizes the constant resistance simulation. This kind of constant resistance simulation implemented by software requires analog-to-digital conversion of the analog voltage signal, and then the single-chip computer calculates the digital quantity and outputs the corresponding control quantity of the digital-to-analog converter to drive the power tube. Finally, it is realized by the successive approximation algorithm. This process takes a long time, resulting in slow response, low reliability...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/40G05F1/46G05B11/42G05B19/042
CPCG01R31/40G05B11/42G05B19/0423G05B2219/21137G05F1/461G05F1/468
Inventor 赵浩华高志齐王恒斌孙伯乐赵志坚王怒
Owner CHANGZHOU TONGHUI ELECTRONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products