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Mode aberration correction device for confocal microscope

A confocal microscope and aberration technology, applied in the direction of measuring devices, material analysis through optical means, instruments, etc., can solve the problems of inconvenient operation, complicated sample pretreatment steps, and complicated aberration correction devices, etc., to achieve simplified devices, Imaging quality improvement, imaging amplitude enhancement effect

Active Publication Date: 2018-05-04
HARBIN INST OF TECH +1
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Problems solved by technology

[0003] The purpose of the present invention is to provide a confocal microscope mode aberration correction device to solve the problems that the existing aberration correction device is too complicated, inconvenient to operate and the sample pretreatment steps are complicated

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  • Mode aberration correction device for confocal microscope

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Embodiment Construction

[0015] Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0016] like figure 1 As shown, the confocal microscope mode aberration correction device of the present invention includes a laser 1, a double-sided 45° mirror 2, a beam splitter 3, a half-wave plate 4, a spatial light modulator 5, a mirror 6, a diaphragm 7. Polarizing beam splitter 8, XY scanning galvanometer 9, scanning lens 10, tube mirror 11, objective lens 12, 1 / 4 wave plate 13, collecting lens 15, fiber hole 16 and photomultiplier tube 17;

[0017] The laser light emitted by the laser 1 is reflected by the mirror surface of one side of the double-sided 45° mirror 2 and then reaches the half-wave plate 4 through the beam splitter 3 , and is modulated by the half-wave plate 4 and then injected into the spatial light modulator 5 . After being modulated by the spatial light modulator 5, it is sent back to the beam splitter 3, and then reflec...

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Abstract

The invention relates to a mode aberration correction device for a confocal microscope, belonging to the technical fields of adaptive optics and confocal microimaging. According to the mode aberrationcorrection device, the problems that an existing aberration correction device is too complex and inconvenient to operate, and sample pretreatment steps of are complex are solved. Laser emitted by a laser device is reflected by a light reflection mirror surface on one side of a double-surface 45-degree light reflection mirror, arrives at a half-wave plate through a beam splitter, is modulated by the beam splitter, is incident into a spatial light modulator, is modulated by the spatial light modulator, is returned to the beam splitter and is reflected to a reflection mirror by the beam splitter; and after high-order diffraction stray light is filtered through a diaphragm, the light is emitted to a light reflection mirror surface on the other side of the light reflection mirror, is reflectedby the double-surface 45-degree light reflection mirror again and is emitted to an XY scanning galvanometer through a polarization beam splitter. According to the mode aberration correction device for the confocal microscope, the image amplitude can be increased by 44% under the conditions that the sample operation is not increased and the imaging device is the simplest, and the imaging quality is increased by 17.

Description

technical field [0001] The invention relates to an aberration correction device, in particular to a device for improving the quality and resolution of confocal imaging by using the aberration correction device, and belongs to the technical field of adaptive optics and confocal microscopic imaging. Background technique [0002] The confocal microscope system has the advantages of high resolution and three-dimensional depth imaging. Its high-resolution characteristics require the focal spot size to be close to the diffraction limit to obtain the best theoretical resolution. However, the assembly error of the optical system and the surface deviation of the optical components will Cause aberrations, resulting in focal spot distortion and resolution reduction. It is necessary to dynamically correct the aberrations generated by these optical systems to improve imaging quality. At present, there is no simple and practical aberration correction device for confocal microscopy systems,...

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Application Information

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IPC IPC(8): G01N21/01G01N21/21
CPCG01N21/01G01N21/21
Inventor 刘辰光赵唯松刘俭陈刚王宇航谭久彬
Owner HARBIN INST OF TECH
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