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Life acceleration model creation method and device and life assessment method

A technology to accelerate model and life, applied in special data processing applications, instruments, electrical and digital data processing, etc., can solve the problems of less failure sample data, shortened test time, and difficult data statistics methods, and achieve reliable life evaluation results. Actual needs, the effect of shortening the test time

Inactive Publication Date: 2018-04-20
HUBEI UNIV OF ARTS & SCI
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Problems solved by technology

[0003] Among them, the reliability analysis based on the on-site data statistics method analyzes the reliability of the failure samples of the IGBT module during the actual working period. Fewer and fewer, statistical methods based on field data are becoming more and more difficult
In addition, the method based on accelerated life test can obtain more failure data in a short time, but it is mainly carried out at a single stress level. As we all know, there is always a limit to the increase of a stress level, exceeding this limit will cause The failure mechanism of the IGBT module changes
In order to keep the failure mechanism constant throughout the test, the stress level should not be raised too high, which in turn limits the shortening of the test time

Method used

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  • Life acceleration model creation method and device and life assessment method
  • Life acceleration model creation method and device and life assessment method
  • Life acceleration model creation method and device and life assessment method

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Embodiment Construction

[0044] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0045] Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art wi...

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Abstract

Embodiments of the invention provide a life acceleration model creation method and device and a life assessment method. The life acceleration model creation method comprises the following steps of: selecting a preset quantity of test sample sets; for each test sample set, obtaining a life data set, under a double-stress level, of each test sample in the test sample set; and establishing a life acceleration model according to each piece of life data in the life data sets and a preset degradation track. According to the life acceleration model creation method, life data of test samples under thedouble-stress level formed by temperature stress and vibration stress is comprehensively considered, so that the established life acceleration model is closer to practical working condition, the practical demands are satisfied and the test time can be effectively shortened at the same time.

Description

technical field [0001] The present invention relates to the technical field of failure prediction of pure electric vehicle motor controllers, in particular to a method for creating a life acceleration model, a device and a life evaluation method. Background technique [0002] With the continuous development of electric vehicle technology, people's demand for the control function of pure electric vehicle motors continues to increase, resulting in an increasingly complex structure of motor controllers. As the core component of the motor controller, the IGBT (Insulated Gate Bipolar Transistor, insulated gate bipolar transistor) module has become particularly important in its reliability. Existing methods for reliability analysis of IGBT modules are mainly divided into two categories, namely reliability analysis based on field data statistics method and reliability analysis based on accelerated life test. [0003] Among them, the reliability analysis based on the on-site data s...

Claims

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Application Information

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IPC IPC(8): G06F19/00
CPCG16Z99/00
Inventor 吴华伟叶从进张远进聂金泉
Owner HUBEI UNIV OF ARTS & SCI
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