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Preparation method of colloid probe for atomic force microscope

An atomic force microscope and probe technology, applied in the field of physics, can solve the problem of the cleanliness of the precision colloidal probe, the difficulty in guaranteeing the success rate and efficiency of processing, the difficulty in guaranteeing the visual imaging quality and motion control accuracy of personalized equipment, and measuring Accuracy and resolution impact and other issues, to achieve the effect of high success rate, guaranteed accuracy and precision, and strong practicability

Active Publication Date: 2018-03-13
UNIV OF SHANGHAI FOR SCI & TECH
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Problems solved by technology

Although the principle and structure are simple, there is no mature and professional colloidal probe preparation equipment at present, and the visual imaging quality and motion control accuracy of personalized equipment are difficult to be guaranteed. The sticking position on the cantilever beam), the cleanliness of the colloidal probe, the success rate and efficiency of processing, etc. are usually difficult to guarantee, which may have a great impact on the measurement accuracy and resolution, and even cause a huge deviation

Method used

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  • Preparation method of colloid probe for atomic force microscope
  • Preparation method of colloid probe for atomic force microscope

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Embodiment Construction

[0036] The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and examples.

[0037] High borosilicate glass microspheres (GL018B / 45-33, MO-Sci Company) with a diameter of about 60 microns were ultrasonically cleaned with acetone and methanol for 5 minutes respectively, and the cleaned high borosilicate glass microspheres were placed in methanol solution and sealed Store for later use.

[0038] Cut the silicon wafer (Silicon Quest International) into small square pieces of about 1cm×1cm, and place the three cut square silicon wafers in acetone solution and isopropanol solution for 2-3 times of ultrasonic cleaning for 5 minutes. Finally, dry the cleaned silicon wafers with clean air to remove surface residues and ensure that the surface of the silicon wafers is clean for future use.

[0039] Gently shake the methanol solution containing the microspheres so that the microspheres are evenly distributed in th...

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Abstract

The invention provides a preparation method of a colloid probe for an atomic force microscope. Under the display function of an optical imaging system of an atomic force microscope, an epoxy adhesiveis pasted to the bottom of the front end of a microcantilever by using a motion control system of the atomic force microscope; and a cleaned microsphere is pasted to the center of the bottom of the front end of the microcantilever accurately by the epoxy adhesive to prepare a colloid probe. According to the preparation method provided by the invention, no special three-dimensional micro-motion operation platform is needed; the operation becomes simple and convenient; the practicability is high; the prepared colloid probe has a smooth and clean surface; and the preparation method is applied tobatched preparation of colloid probes in a laboratory.

Description

technical field [0001] The invention belongs to the field of physics, and relates to an atomic force microscope, in particular to a method for preparing a colloidal probe for an atomic force microscope. Background technique [0002] Atomic Force Microscope (AFM) is a micron-scale precision measuring instrument invented by Binning et al. in 1986. One of the key components to achieve precise measurement is the AFM probe. The AFM probe is mainly composed of a substrate, a micro-cantilever beam and a tip at the free end of the cantilever beam. During the scanning measurement process, the tip of the free end of the micro-cantilever is close to the surface of the sample to be measured, and the interaction force between the two causes the bending of the micro-cantilever. The laser measurement method is used to detect the bending of the micro-cantilever beam in real time to achieve different measurement purposes. At the beginning of the emergence of AFM, it was mainly used for the...

Claims

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Application Information

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IPC IPC(8): G01Q60/38
Inventor 景大雷
Owner UNIV OF SHANGHAI FOR SCI & TECH
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