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CT data correction method and step test member

A data correction and test piece technology, applied in the field of medical imaging, can solve the problems of poor correction effect, lack of applicability, and affecting the quality of CT reconstruction images.

Active Publication Date: 2018-01-09
重庆真测科技股份有限公司 +2
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Problems solved by technology

Therefore, the dark field measurement value will affect the CT reconstruction image quality
In the case of X-rays, when each detector in the detector array obtains the same dose of X-rays, its dose value will still show differences, resulting in inconsistencies between detectors
[0005] The existing CT data correction schemes have the following problems: 1) Only dark-field correction is naturally performed on the data, and air correction is a relatively simple correction method, which is less effective in correcting image hardening caused by multi-energy spectrum rays and image problems such as ray scattering. Poor; 2) Lack of wide applicability, data correction can only be performed on specific CT data or specific CT image problems
This problem will seriously affect the quality of CT reconstruction images, so corresponding methods are required for correction

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  • CT data correction method and step test member

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Embodiment Construction

[0030] The specific content of the present invention will be described in detail below with reference to the drawings.

[0031] The invention discloses a CT data correction method, including dark field correction, air correction and CT data non-linear correction. The specific steps are as follows:

[0032] 1. Use CT system to collect dark field data and air data;

[0033] In the absence of X-rays, the dark-field data DARK(i) is collected by the detector of the CT system, where i represents the detector number. In the case of X-rays but no DUT, it is collected by the detector of the CT system Air data AIR(i), where i represents the detector number. Each detector unit corresponds to a dark field data and an air data. Therefore, the dark field data and the air data are two data sequences, as shown in the attached file. Figure 4 Shown.

[0034] 2. Scan the ladder test piece with a CT system to collect ladder CT data;

[0035] Use X-rays to scan the ladder test piece layer by layer. The t...

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Abstract

The invention discloses a CT data correction method; the method uses a step test member to obtain detector dosage nature logarithm values under different equivalent steel thicknesses; the method comprises the following steps: using polynomial fitting to fit a real ray integration curve; solving an ideal ray integration curve; carrying out non-linear corrections for the CT data according to the corresponding relation between two said curves. The method can solve CT data non-linear problems caused by pluripoten ray hardening, ray scattering and detector non-linear physics or system reasons, thusrealizing hardening, scattering and detector non-linear data corrections; the invention also discloses a CT data correction step test member having a plurality of equivalent steel thickness layers, wherein the test member density equals to the standard steel.

Description

Technical field [0001] The invention relates to the technical field of medical imaging, in particular to a CT data correction method. Background technique [0002] At the end of the 19th century, William Roentgen discovered X-rays. After that, the use of X-rays to inspect the internal structure of objects has become an important means of non-destructive testing. With the development of computer technology, the application of computers has gradually penetrated into various disciplines. CT (Computed Tomography) is a new nondestructive testing method formed by the intersection of computer science and high-energy physics. This technology realizes tomographic image scanning and reconstruction of the measured object. And widely used in medical and industrial fields. [0003] Due to the physical characteristics of X-rays or the system itself, CT reconstructed images may have image quality problems, and CT data needs to be corrected. [0004] Due to its electronic components, the detect...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00A61B6/00
Inventor 邱焓王珏蔡玉芳邹永宁刘荣苏志军穆洪彬
Owner 重庆真测科技股份有限公司
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