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Method for super-high-speed interpretive execution of assembly instructions of TMS320C25 chip in X86 computer

A TMS320C25, interpretation and execution technology, applied in the direction of electrical digital data processing, program code conversion, program control design, etc., can solve problems such as black box testing, poor quality of assembly code programs, lack of emulators, etc.

Active Publication Date: 2017-11-28
BEIJING INST OF COMP TECH & APPL
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In software testing, the program written in assembly language has poor readability, low code review efficiency, and there are few related testing support tools, and the available testing methods are limited, or because of the lack of emulators that support this kind of chip, it can only be carried out. Code review or black box testing
Due to limited testing methods and means, the quality of assembly code programs is also unsatisfactory
To fully test the assembly language program, the test cycle is long and difficult

Method used

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  • Method for super-high-speed interpretive execution of assembly instructions of TMS320C25 chip in X86 computer
  • Method for super-high-speed interpretive execution of assembly instructions of TMS320C25 chip in X86 computer
  • Method for super-high-speed interpretive execution of assembly instructions of TMS320C25 chip in X86 computer

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0040] Example 1: Direct translation of assembly code into C code

[0041]

example 2

[0042] Example 2: The binary code corresponding to the assembly code is translated into C code

[0043]

[0044] 2. Data in the program area

[0045] In the assembly code, the program area will also burn some fixed-value data for calculation, and use special instructions to move to the data area during the running of the program.

[0046] The pre-compilation method uses a special array to simulate the data written in the program area. During the pre-processing translation process, the value is directly written into the defined array, and the data label is defined as a macro, so that it can be directly read from the read from the array.

[0047] See Example 3 for how to process data in the PM program area.

example 3

[0048] Example 3: How to handle data in the PM program area

[0049]

[0050] 3. Data area simulation

[0051] The precompilation processing method directly uses the array to simulate the data area, for example, define an array unsigned int MEM[0x80000] with a size of 512k×32, and the addressing space of TMS320C25 is 64K×16, and adopts the addressing mode combining 9-bit page pointer and 7-bit address , so the data area can be defined as a 2-dimensional array unsigned short MEM[512][128].

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Abstract

The invention relates to a method for super-high-speed interpretive execution of assembly instructions of a TMS320C25 chip in an X86 computer, and belongs to the technical field of power. According to the method, the assembly instructions can be efficiently and quickly subjected to simulative running in a Windows environment without use of a special simulator; and by virtue of multiple universal test tools, massive test cases are executed at a high speed, the functional correctness of an assembly language program is quickly and effectively verified, code coverage is obtained, and a device under test is subjected to a white box test, so that the test fullness of the assembly language program is improved.

Description

technical field [0001] The invention relates to the technical field of software testing, in particular to a method for interpreting and executing TMS320C25 chip assembly instructions on an X86 computer at super high speed. Background technique [0002] In software testing, the program written in assembly language has poor readability, low code review efficiency, and there are few related testing support tools, and the available testing methods are limited, or because of the lack of emulators that support this kind of chip, it can only be carried out. Code review or black box testing. Due to limited testing methods and means, the quality of assembly code programs is also unsatisfactory. To fully test the assembly language program, the test cycle is long and difficult. Contents of the invention [0003] (1) Technical problems to be solved [0004] The technical problem to be solved by the present invention is: how to interpret and execute TMS320C25 chip assembly instructi...

Claims

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Application Information

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IPC IPC(8): G06F9/45G06F9/44G06F11/36
CPCG06F8/315G06F8/4435G06F8/447G06F8/51G06F11/362G06F11/3688
Inventor 杨波李敏李伟
Owner BEIJING INST OF COMP TECH & APPL
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