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A kind of calibration method of LED photoelectric comprehensive tester

A technology of optoelectronic synthesis and calibration method, which is used in optical instrument testing, optical performance testing, and testing of machine/structural components. accuracy and efficiency, the effect of reducing the cost of calibration

Active Publication Date: 2020-06-30
深圳天溯计量检测股份有限公司
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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a calibration method for an LED photoelectric comprehensive tester in view of the disadvantages of the prior art, such as the complicated calibration process and the need to spend a lot of time and energy, when calibrating the special test device for LEDs

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  • A kind of calibration method of LED photoelectric comprehensive tester
  • A kind of calibration method of LED photoelectric comprehensive tester
  • A kind of calibration method of LED photoelectric comprehensive tester

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Embodiment Construction

[0048] The content of the present invention will be further described below in conjunction with the accompanying drawings.

[0049] In the present invention, light intensity refers to the luminous intensity, the unit is cd, 1cd or 1000mcd refers to the light of a monochromatic light source (frequency 540×1012Hz, wavelength 0.550μm) in a given direction (the radiation intensity in this direction is ( 1 / 683)w / sr)) The luminous intensity emitted within the unit solid angle; luminous flux refers to the radiant power that the human eye can feel, which is equal to the radiant energy of a certain band per unit time and the relative viewing rate of this band The product of the color temperature is the most common indicator of the spectral quality of the light source. It is generally expressed by Tc. The color temperature is defined by absolute black body. When the radiation of the light source in the visible region is exactly the same as that of the absolute black body, then the temperatu...

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Abstract

The invention relates to the field of LED tests of LED photoelectric comprehensive testers, in particular to a calibration method of an LED photoelectric comprehensive tester. The LED photoelectric comprehensive tester comprises an integrating sphere, a photoelectric detector, an A / D circuit and a test control system. The calibration method comprises following steps of measuring wavelength errors, wavelength repeatability, color and temperature errors, luminous flux errors, light intensity errors, forward voltage errors, forward current errors, backward voltage errors and backward leakage current errors of the to-be-calibrated LED photoelectric comprehensive tester; and carrying out wavelength calibration, color and temperature calibration, luminous flux calibration, light intensity calibration, forward electrical performance calibration and backward electrical performance calibration on the to-be-calibrated LED photoelectric comprehensive tester. According to the invention, various photoelectric test parameters can be calibrated simultaneously without professional calibration tools; calibration processes are simple; calibration cost is reduced; calibration time is reduced and energy is saved; and accuracy and efficiency of the calibration are improved.

Description

Technical field: [0001] The present invention relates to the field of LED testing, in particular to an LED photoelectric integrated tester, in particular to a calibration method of an LED photoelectric integrated tester. Background technique: [0002] LED, short for light emitting diode, is a type of semiconductor diode that can convert electrical energy into light energy. Every manufacturer needs to perform photoelectric testing on the LEDs produced, and photoelectric testing is an important and only way to test the photoelectric performance of LEDs. At present, the test of LED mainly includes manual visual inspection and special test equipment. Manual visual inspection requires the physical fitness and experience of the inspector. Usually, the workload is large and the visual fatigue is easy, which leads to missed inspections and misjudgments, and ultimately leads to low efficiency. And other shortcomings; and the special test device has many configurations and strong professi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00G01M11/02
CPCG01M11/00G01R35/005
Inventor 龚天保黎丛兵龚敏吴百香曾宏勋杨轩元
Owner 深圳天溯计量检测股份有限公司
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