Test setups and multi-line test systems
A test device and simulation test technology, applied in the direction of test/monitoring control system, general control system, control/regulation system, etc., can solve the problems of low reliability and low efficiency of multi-connected control boards, so as to avoid slow speed and improve The effect of testing efficiency
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[0013] The specific implementation manners of the present application will be described in further detail below in conjunction with the accompanying drawings.
[0014] The test device proposed in this application, such as figure 1 As shown, it includes a substrate 1 and a slave board 2; the substrate 1 includes a main control chip U1 and a substrate interface J1; the main control chip U1 includes a first test signal output port P11, P12, ..., P1N for outputting a first test signal and second test signal output ports P21, P22, . . . , P2M for outputting second test signals; wherein, N and M are both integers. The slave board 2 includes a slave board interface J2, a digital-to-analog conversion circuit U2, an analog test signal output interface J3, and a digital test signal output interface J4.
[0015] The first test signal output port P11, P12, ..., P1N and the second test signal output port P21, P22, ..., P2M are connected to the substrate interface J1; the slave board inter...
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