Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Method for testing correctness of device model simulation results

A technology of model simulation and device model, applied in the direction of instruments, special data processing applications, electrical digital data processing, etc., can solve problems such as inaccurate positioning, long design circuit simulation time, difficult positioning, etc., to save evaluation costs and save debugging cost effect

Active Publication Date: 2017-07-07
北京华大九天科技股份有限公司
View PDF5 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] 1. It is very time-consuming, because the simulation time of the designed circuit is generally longer;
[0007] 2. It cannot completely cover all the basic unit devices in the device model library, because all device models cannot be used in any circuit;
[0008] 3. If there is a problem, it is difficult to locate. It can only be judged that there is a problem with the support of the device model by the simulation software, but it cannot be accurately located which device model is causing it.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for testing correctness of device model simulation results
  • Method for testing correctness of device model simulation results
  • Method for testing correctness of device model simulation results

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0032] figure 1 For the method flow chart of the correctness of test device model simulation result according to the present invention, reference will be made below figure 1 , the method for testing the correctness of the device model simulation result of the present invention is described in detail.

[0033] In step 101, a circuit simulation netlist is generated based on the device model and test requirements;

[0034] In this step, independent test netlists are generated one by one according to the device model, and simple and intuitive circuits are used to replace complex functional design circuits, which are used for circuit simulation by simulation software. ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for testing correctness of device model simulation results. The method comprises the following steps of: generating a circuit simulation netlist on the basis of a device model and a test demand; respectively carrying out simulation by adoption of comparative simulation software and to-be-tested simulation software on the basis of the circuit simulation netlist; and generating a simulation test result on the basis of the simulation result. The method for testing correctness of device model simulation results is an efficient and visual test method; according to the method, a most basic device model building circuit is simulated; and the method is compared with a gold analysis tool to generate a result report which is easy to check, so that simulation software engineers are helped to rapidly and conveniently check the result of supporting the device model by the simulation software so as to save the debugging cost, and circuit design engineers of design companies are helped to rapidly assess whether the support, for the device model, of new simulation software is consistent with the support, for the device model, of the existing simulation software or not so as to save the assessment cost.

Description

technical field [0001] The invention relates to the technical field of semiconductor integrated circuit design, in particular to a method for testing the correctness of device model simulation results. Background technique [0002] The simulation circuit simulator SPICE (Simulation program with integrated circuit emphasis) was first proposed by Professor Donald of the University of California, Berkeley at the 16th Midwest Circuit Theory Symposium on April 12, 1973. Through SPICE analysis, the performance of the circuit can be changed, optimized and verified by considering important design parameters such as process characteristics and temperature during the entire process of circuit design. In modern integrated circuit design, SPICE has become a standard design step, widely used to verify the original design and performance optimization. Therefore, circuit simulation is an important part of the integrated circuit design process. Accurate simulation results can effectively i...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/367
Inventor 阮利华张秀梅吴大可周振亚
Owner 北京华大九天科技股份有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products