Method for testing correctness of device model simulation results
A technology of model simulation and device model, applied in the direction of instruments, special data processing applications, electrical digital data processing, etc., can solve problems such as inaccurate positioning, long design circuit simulation time, difficult positioning, etc., to save evaluation costs and save debugging cost effect
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[0031] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.
[0032] figure 1 For the method flow chart of the correctness of test device model simulation result according to the present invention, reference will be made below figure 1 , the method for testing the correctness of the device model simulation result of the present invention is described in detail.
[0033] In step 101, a circuit simulation netlist is generated based on the device model and test requirements;
[0034] In this step, independent test netlists are generated one by one according to the device model, and simple and intuitive circuits are used to replace complex functional design circuits, which are used for circuit simulation by simulation software. ...
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