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A high-precision temperature-controlled resistance test system

A resistance testing, high-precision technology, applied in the direction of radiation pyrometry, measuring resistance/reactance/impedance, measuring devices, etc., can solve the problems of test temperature error, temperature unevenness, poor precision of thermocouple, etc., and achieve the improvement of test accuracy , Guarantee test accuracy, enhance the effect of temperature uniformity

Active Publication Date: 2020-02-14
SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, due to temperature inhomogeneity caused by heating parts / heat transfer parts / sample itself, etc., the temperature of not all positions on the sample surface will reach the test temperature, thus causing test errors
[0004] At the same time, the accuracy of the thermocouple itself is relatively poor; when the samples to be tested use different materials, the contact characteristics between the thermocouple and different materials and how to calibrate on-line will further increase the error of the test temperature

Method used

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  • A high-precision temperature-controlled resistance test system

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Embodiment Construction

[0024] The specific embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.

[0025] It should be noted that in the following specific embodiments, when the embodiments of the present invention are described in detail, in order to clearly show the structure of the present invention for ease of description, the structure in the drawings is not drawn according to the general scale. Partial enlargement, deformation, and simplification of processing have been implemented. Therefore, this should be avoided as a limitation of the present invention.

[0026] In the following specific embodiments of the present invention, please refer to figure 1 , figure 1 It is a schematic structural diagram of a high-precision temperature-controlled resistance test system according to a preferred embodiment of the present invention. Such as figure 1 As shown, a high-precision temperature-controlled resistance test system of the prese...

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PUM

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Abstract

The invention discloses a high-precision temperature-controlled resistance testing system, comprising: a sample platform for placing test samples, the sample platform is provided with a heat conduction plane, the heat conduction plane has a heat dispersion plane, and the test sample is placed On the heat dispersion plane; the heater, located under the sample platform, is used to heat the test sample on the sample platform to the test temperature; the infrared imaging temperature detector is used to measure the surface temperature of the test sample; the probe is used to test the sample When the surface temperature reaches the test temperature, the resistance test is performed on the test sample. The invention can realize the online calibration of the infrared imaging temperature detector while monitoring the temperature values ​​of all positions on the sample surface in real time, thereby ensuring the resistance test accuracy of any position on the sample surface.

Description

Technical field [0001] The present invention relates to the technical field of integrated circuit testing, and more specifically, to a high-precision temperature-controlled resistance testing system. Background technique [0002] The conventional temperature-controlled resistance test system uses a thermocouple to test the temperature at a fixed position on the sample, and after waiting for the temperature at the fixed position to reach the test temperature, the control system of the probe machine controls the probe to contact the surface of the sample. Resistance test at different positions on the sample surface at this temperature. [0003] However, the temperature inhomogeneity caused by the heating part / heat transfer part / sample itself, etc. will cause the temperature of not all positions on the sample surface to reach the test temperature, which will lead to test errors. [0004] At the same time, the accuracy of the thermocouple itself is relatively poor; when the sample to be...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/02G01R35/02G01J5/00
CPCG01J5/00G01R27/02G01R35/02G01J5/80
Inventor 康晓旭
Owner SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT
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