Method for measuring planeness through lattice structure light
A technology of lattice structure and measurement method, applied in measurement devices, optical devices, instruments, etc.
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[0054] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0055] A method for measuring flatness with lattice structured light, comprising: the following steps:
[0056] Step 1: Use the checkerboard calibration board to calibrate the image collector to obtain the internal parameter matrix of the image collector, the distortion coefficient and the external parameters of the image collector relative to the plane to be measured, namely the rotation vector and translation vector. As a preference, the image collector is a monocular camera.
[0057] Step 2: Theoretically deduce the distribution of the lattice structured light on the ideal plane at the position to be measured, and obtain the coordinates of each point in the lattice in the world coordinate system; the lattice structured light is generated by the projection image generated by the projector as the light source , or by the diffraction image g...
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