Pressurized water reactor nuclear power plant nuclear-grade digital instrument control system logical function test device

Abstract

The invention belongs to the nuclear process control system reliability detection field and relates to a pressurized water reactor nuclear power plant nuclear-grade digital instrument control system logical function test device. The pressurized water reactor nuclear power plant nuclear-grade digital instrument control system logical function test device includes a host computer, a switch, a printer and a network connection medium. According to the device, a network communication mode-based device structure is adopted. Before a logic function test is performed, a KCS is connected into the special test device, after the test is completed, the communication connection of the special test device and the KCS is cut off; a test network and a network which is adopted under a normal operation condition are relatively independent; and an independent communication card is adopted, so that the safety of the KCS can be ensured.

Description

technical field [0001] The invention belongs to the field of reliability detection of nuclear process control systems, and in particular relates to a logic function test device for a nuclear-level digital instrument control system of a pressurized water reactor nuclear power plant. Background technique [0002] The nuclear-level digital instrument control system (hereinafter referred to as KCS) is an important safety system in the digital instrument control system of nuclear power plants. Its main function is to shut down and / or activate special safety facilities , to prevent or mitigate damage to the core and coolant system components, protect the integrity of the three major nuclear safety barriers, avoid causing a large amount of radioactive material to escape, and protect the surrounding environment of the nuclear power plant from pollution and the safety of personnel. [0003] According to the requirements of relevant nuclear power regulations and guidelines, in order t...

AI Technical Summary

Problems solved by technology

[0004] The regular test of logic function is carried out during the overhaul period of the unit shutdown and refueling. Traditional test devices mostly use the method of injecting and collecting analog signals. The test risk is high, the amount of manual operation is large, and the level of automation is low. and manpower bring greater pressure, but also bring greater security risks

Images