Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!
Copper alloy plate and manufacturing method of copper alloy plate
What is Al technical title?
Al technical title is built by PatSnap Al team. It summarizes the technical point description of the patent document.
A technology of copper alloy plate and manufacturing method, applied in the field of copper alloy plate, capable of solving the problems of insufficient electrical conductivity and strength characteristics of Cu-Zn-Sn alloy, etc.
Active Publication Date: 2018-04-24
MITSUBISHI SHINDOH CO LTD
View PDF4 Cites 0 Cited by
Summary
Abstract
Description
Claims
Application Information
AI Technical Summary
This helps you quickly interpret patents by identifying the three key elements:
Problems solved by technology
Method used
Benefits of technology
Problems solved by technology
[0015] Furthermore, the Cu-Zn-Sn alloy described in Patent Document 1 is not sufficient in many properties including electrical conductivity and strength.
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more
Image
Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
Click on the blue label to locate the original text in one second.
Reading with bidirectional positioning of images and text.
Smart Image
Examples
Experimental program
Comparison scheme
Effect test
Embodiment
[0160] The results of confirmation experiments conducted to confirm the effects of the present invention are shown below. In addition, the following examples are used to illustrate the effects of the present invention, and the structures, processes and conditions described in the examples do not limit the technical scope of the present invention.
[0161] Using the copper alloy sheets according to the first to fourth embodiments of the present invention and the copper alloy sheets of the comparative composition described above, samples were produced by changing the manufacturing process. The composition of the copper alloy is shown in Tables 1-3. In addition, Tables 1 to 3 show the values of the composition relational expressions f1, f2, f3, f4, and f5 shown in the above-mentioned embodiment.
[0162] The manufacturing steps of the samples were performed in three types, A, B, and C, and the manufacturing conditions were changed for each manufacturing step. Manufacturing pr...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More
PUM
Property
Measurement
Unit
particle size
aaaaa
aaaaa
particle diameter
aaaaa
aaaaa
particle diameter
aaaaa
aaaaa
Login to View More
Abstract
Provided is a copper alloy sheet which is excellent in terms of resistance to stress corrosion cracking, stress relaxation property, tensile strength, proof stress, electrical conductivity, bendability, and solder wettability. The copper alloy sheet contains 4-14 mass% Zn, 0.1-1 mass% Sn, 0.005-0.08 mass% P, and 1.0-2.4 mass% Ni, with the remainder comprising Cu and unavoidable impurities, and satisfies the relational expressions 7≤[Zn]+3×[Sn]+2×[Ni]≤18, 0≤[Zn]-0.3×[Sn]-1.8×[Ni]≤11, 0.3≤(3×[Ni]+0.5×[Sn]) / [Zn]≤1.6, 1.8≤[Ni] / [Sn]≤10, and 16≤[Ni] / [P]≤250. The copper alloy sheet has an average crystal grain diameter of 2-9 μm and contains circular or elliptic precipitates which have an average grain diameter of 3-75 nm or in which precipitate grains each having a grain diameter of 3-75 nm account for 70% by number or more of all the circular or elliptic precipitates. The copper alloy sheet has an electrical conductivity of 24% IACS or greater and a degree of stress relaxation, measured at 150°C for 1,000 hours as an index to resistance to stress relaxation, of 25% or less.
Description
technical field [0001] The present invention relates to a copper alloy plate with excellent stress corrosion cracking resistance, stress relaxation characteristics, tensile strength, yield strength, electrical conductivity, bending processability, and solder wettability, especially a copper alloy plate for terminals / connectors, Copper alloy plate for electric / electronic components and method for producing the copper alloy plate. [0002] This application claims priority based on Japanese Patent Application No. 2014-196430 for which it applied in Japan on September 26, 2014, and uses the content here. Background technique [0003] Conventionally, as constituent materials for connectors, terminals, relays, springs, switches, semiconductors, lead frames, etc. used in automotive components, electrical components, electronic components, communication devices, electronic / electrical devices, etc., highly conductive and high-strength copper alloy plate. However, along with recent ...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More
Application Information
Patent Timeline
Application Date:The date an application was filed.
Publication Date:The date a patent or application was officially published.
First Publication Date:The earliest publication date of a patent with the same application number.
Issue Date:Publication date of the patent grant document.
PCT Entry Date:The Entry date of PCT National Phase.
Estimated Expiry Date:The statutory expiry date of a patent right according to the Patent Law, and it is the longest term of protection that the patent right can achieve without the termination of the patent right due to other reasons(Term extension factor has been taken into account ).
Invalid Date:Actual expiry date is based on effective date or publication date of legal transaction data of invalid patent.