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Chip test fixture and chip test system

A chip testing and fixture technology, applied in RF circuit testing, electronic circuit testing, measuring devices, etc., can solve problems such as reducing test accuracy, and achieve the effect of improving accuracy, avoiding damage, and avoiding tremors

Active Publication Date: 2016-11-09
CHINA COMM MICROELECTRONICS TECH CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Based on this, it is necessary to provide a chip test fixture and a chip test system for how to improve the problem of how to improve the traditional test method to reduce the test accuracy due to human factors

Method used

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  • Chip test fixture and chip test system
  • Chip test fixture and chip test system
  • Chip test fixture and chip test system

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Embodiment Construction

[0025] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0026] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terminology used herein in the description of the invention is for the purpose of describing specific embodiments only, and is not intended to limit the present invention. As used herein, the term "and / or" includes any and all combinations of one or more of the ...

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Abstract

The present invention relates to a chip test fixture. The chip test fixture comprises a base and a fine adjustment structure; the base is provided with an accommodating structure; the accommodating structure is used for accommodating a calibration component and a chip supporting plate and can make the calibration component contact with the chip supporting plate; a microwave chip to be tested can be welded onto the surface of the chip supporting plate; the fine adjustment structure is installed on the base; and the fine adjustment structure is used for adjusting and fixing the positions of the calibration component and the chip supporting plate. According to the chip test fixture and the chip test system of the invention, the positions of the calibration component and the chip supporting plate can be adjusted and fixed through the accommodating structure and the fine adjustment structure; and the calibration component can be aligned with the microwave chip to be tested on the chip supporting plate, and after the calibration component and the chip supporting plate are fixed, the calibration component and microwave chip to be tested can be kept fixed without manual operation required, and therefore, shake caused by manual operation can be avoided, and thus, test accuracy can be improved, and damage to the microwave chip can be avoided.

Description

technical field [0001] The invention relates to the technical field of microwave testing, in particular to a chip testing fixture and a chip testing system. Background technique [0002] Usually, the method for testing microwave devices is as follows: connect the positive pole of the external DC power supply to the bottom of the microwave chip, and connect the negative pole to a calibrator. At the same time, the calibration piece is connected to the upper surface of the microwave chip, and the contact point and contact position between the calibration piece and the microwave chip are manually controlled by a person, so that the test port of the microwave chip is aligned with the calibration piece. [0003] However, there are following defects in the traditional test method: (1) Although the human arm is placed on the table, it is inevitable to tremble due to factors such as physiology. Then, the contact point between the calibration piece and the microwave chip will change ...

Claims

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Application Information

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IPC IPC(8): G01R1/04G01R31/28
CPCG01R1/0425G01R31/2822G01R1/04G01R31/28
Inventor 高琳王永康丁庆
Owner CHINA COMM MICROELECTRONICS TECH CO LTD
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