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Full view field X-ray fluorescence imaging system and full view field X-ray fluorescence imaging method

A fluorescence imaging and imaging method technology, applied in the field of full-field X-ray fluorescence imaging system and imaging, can solve the problems of difficult to meet the analysis requirements of complex samples, low energy spectral resolution, and taking a long time.

Inactive Publication Date: 2016-11-09
INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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  • Claims
  • Application Information

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Problems solved by technology

If this technique is to obtain high spatially resolved X-ray fluorescence images in a large sample range, it takes a long time to scan point by point, and the equipment requires high alignment accuracy and complex motion scanning mechanisms. type detectors, the resolution of the energy spectrum is relatively low, and it is difficult to meet the analysis requirements of complex samples

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  • Full view field X-ray fluorescence imaging system and full view field X-ray fluorescence imaging method

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Embodiment Construction

[0029] All features disclosed in this specification, or steps in all methods or processes disclosed, may be combined in any manner, except for mutually exclusive features and / or steps.

[0030] Any feature disclosed in this specification (including any appended claims, abstract and drawings), unless expressly stated otherwise, may be replaced by alternative features which are equivalent or serve a similar purpose. That is, unless expressly stated otherwise, each feature is one example only of a series of equivalent or similar features.

[0031] The imaging system of this program includes an X-ray light source, a filter group, a sample stage, a spherical crystal, a light-limiting filter device, a two-dimensional spatially resolved detector, and a computer; the sample is placed on the sample platform; the X-rays emitted by the X-ray light source are irradiated on the On the sample, the X-ray fluorescence emitted by the sample is focused and imaged on the detector after passing t...

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Abstract

The invention provides a full view field X-ray fluorescence imaging system and a full view field X-ray fluorescence imaging method. The system comprises an X-ray source, a filter disk assembly, a sample stage, a spherical crystal, a light limiting and filtering device, a two-dimensional spatial resolution detector and a computer; a sample is arranged on the sample stage; X rays emitted by the X-ray source irradiate the sample, and X-ray fluorescence emitted by the sample sequentially goes through the light limiting and filtering device and the spherical crystal to undergo filtering menu, and then is focused and imaged on the detector; and the computer can control the X-ray source and receive return information of the detector. The system and the method can realize non-scanning full view field X-ray fluorescence imaging in order to obtain the content and the two-dimensional distribution image of one element in the sample to be detected. The full view field X-ray fluorescence imaging method has the advantages of large view field, high spatial resolution, extremely high spectral resolution, large field depth, fast image acquisition speed, realization of individual analysis of various elements in the sample one by one, and low noise interference caused by fluorescence or scattering of other elements.

Description

technical field [0001] The present invention relates to a full-field X-ray fluorescence imaging system and an imaging method in particular. Background technique [0002] X-ray fluorescence imaging analysis is a powerful element analysis method. It can not only give the element composition and content of the sample, but also give the spatial distribution of elements in the sample. Therefore, it is widely used in industry, agriculture, chemistry, environment, materials, biology There is a strong demand in many fields such as medicine, archaeology and so on. For example, in biological or medical diagnosis, if the spatial distribution and content of certain trace (metal) elements in tissues can be clearly obtained, it will greatly promote and help related research. Most of the current X-ray fluorescence imaging technology adopts microbeam-based scanning imaging method, which uses X-ray focusing optical elements (capillary device, Fresnel zone plate, K-B mirror, birefringent len...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/223
CPCG01N23/223G01N2223/406
Inventor 阳庆国
Owner INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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