Open-circuit fault diagnosis method of cascaded STATCOM system IGBT

A technology of open-circuit fault and diagnosis method, which is applied in the direction of measuring devices, instruments, and measuring electronics. It can solve the problems of increasing IGBT failure, long diagnosis time, and misdiagnosis, so as to reduce misdiagnosis, improve diagnostic accuracy, and reduce The effect of time to diagnosis

Inactive Publication Date: 2016-10-12
YANCHENG INST OF TECH
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the working environment of the STATCOM system is generally in high voltage and high electromagnetic interference, and from the perspective of industrial application (volume, power consumption, etc.), the design of various protections should not be too complicated, which increases the possibility of IGBT failure. probability
Restricted by the working environment, installation location, manufacturing process, etc., its reliability problem has not been effectively solved
The three-phase output voltage signal is used as the original signal, which is easily affected by the fluctuation of the power supply voltage, while the output current signal is easily affected by the fluctuation of the load, resulting in poor fault diagnosis effect and easy to cause misdiagnosis
In addition, the diagnosis time is longer

Method used

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  • Open-circuit fault diagnosis method of cascaded STATCOM system IGBT
  • Open-circuit fault diagnosis method of cascaded STATCOM system IGBT
  • Open-circuit fault diagnosis method of cascaded STATCOM system IGBT

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Embodiment Construction

[0036] The invention discloses a method for diagnosing an open circuit fault of a cascaded STATCOM system IGBT, which comprises the following steps:

[0037] S1: The FPGA control board collects the capacitor voltage signal as the original signal, collects 20 sets of original signals for each fault type, and transmits the original signal to the main FPGA control board; figure 2 — Figure 5 Respectively, the current i of the grid-side system monitored by the upper computer Matlab tool under normal conditions sa , A-phase first power module capacitor voltage U dcA1 , load current i la and device current (after LCL filter)i ca ; Figure 6 — Figure 9 are the grid-side system current i monitored by the upper computer Matlab tool under the condition of Ta11 open circuit fault sa , A-phase first power module capacitor voltage U dcA1 , load current i la and device current (after LCL filter) i ca .

[0038] S2: The main FPGA control board transmits the original signal to the...

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Abstract

The invention discloses an open-circuit fault diagnosis method of a cascaded STATCOM system IGBT. A capacitance and voltage signal with a semi fundamental wave period serves as an original signal to be processed, features of fault signals can be maintained, and diagnosis instantaneity can also be guaranteed. By means of a multi-core least square support vector machine improved through a feature dimension reduction, diagnosis accuracy is improved, and diagnosis time is shortened. The method further reduces misdiagnosis caused by load changes, and inherits the small-sample learning advantage of a traditional SVM classification method.

Description

technical field [0001] The invention relates to a cascaded STATCOM system, in particular to an open circuit fault diagnosis method for an IGBT of the cascaded STATCOM system. Background technique [0002] The cascaded static synchronous compensator (STATCOM) device can compensate the capacitive or inductive reactive power of the grid system to enhance the stability of the grid system. A cascaded STATCOM system usually consists of a controller, a converter, a filtering device, and a cooling device. The failure of each part will affect the operation of the system, and in severe cases it will cause the system to shut down. Among them, the failure of the controller and cooling device has formed a mature solution through measures such as temperature monitoring and relay protection configuration. However, the insulated-gate bipolar transistors (IGBTs) that make up the H-bridge power module in the converter are also prone to failure due to the long-term working environment of high...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2617
Inventor 杨晓冬段文勇杨伯平胡国文顾春雷
Owner YANCHENG INST OF TECH
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