Novel method for extracting information of one-shot hard X-ray grating interferometer
A technology of grating interference and information extraction, applied in the field of X-ray imaging physics, can solve the problems of increasing the radiation dose and radiation damage of objects, hindering the popularization and application of the hard X-ray grating interferometer method, and long image data acquisition time, so as to reduce radiation exposure. Risk of damage, reduced requirements for mechanical stability, effect of reduced experimental time
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[0040] In this embodiment, such as figure 1 As shown, the hard X-ray grating interferometer includes: X-ray source, source grating G0, beam splitting grating G1, analysis grating G2, and detector; a new method for extracting information from a single-exposure hard X-ray grating interferometer is Proceed as follows:
[0041] Step 1. Fix any two of the source grating G0, beam splitting grating G1 and analysis grating G2, and move the other grating along the moving direction by a quarter of the grating period, so that the hard X-ray grating interferometer works The left half waist or right half waist position of the light intensity change curve ( figure 2 The middle arrow indicates the position); the moving direction is the direction perpendicular to the optical axis and the grating bar at the same time;
[0042] The hard X-ray grating interferometer works at the left half waist or right half waist position of the light intensity change curve, so that the measurement sensitivity of ...
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