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Solar cell epitaxial wafer and manufacturing method thereof

A technology of a solar cell and a manufacturing method, applied in the field of solar cells, can solve the problems of damage to the cell layer, gas accumulation, and difficulty in discharging, and achieve the effects of preventing damage, reducing time, and improving yield.

Active Publication Date: 2015-12-09
SUZHOU JUZHEN PHOTOELECTRIC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This situation will lead to: 1. The acid solution corrodes faster in some areas (the acid solution goes deep into the interior along the irregular channel), while the corrosion is slower in some areas
The gas generated in the rapidly corroded area is easy to accumulate between the substrate and the GaAs battery layer and is not easy to discharge, which hinders the further corrosion of the sacrificial layer by the acidic solution or hinders the supplement of the acidic solution to the front of the corrosion chemical reaction; 2. The gas cannot be discharged in time, and it is easy to cause the oxygen contained in the gas to react with the GaAs battery layer or substrate, resulting in damage to the battery layer (the reaction between oxygen and GaAs will cause GaAs to be more easily corroded by acid solution) or substrate defects that are not easy to repair (It has an impact on the secondary utilization of the substrate); 3. Gas accumulation will generate a certain pressure inside, and in severe cases, it will damage the GaAs battery layer or substrate

Method used

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  • Solar cell epitaxial wafer and manufacturing method thereof
  • Solar cell epitaxial wafer and manufacturing method thereof
  • Solar cell epitaxial wafer and manufacturing method thereof

Examples

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Embodiment 1

[0039] Such as figure 1 with 2As shown, this embodiment provides a solar cell epitaxial wafer, including a substrate 1, a buffer layer 2, a sacrificial layer 3 and a solar cell layer 4 arranged in sequence, wherein the sacrificial layer 3 includes a first sacrificial layer 31 and a second sacrificial layer 31. Sacrificial layer 32, the first sacrificial layer 31 is arranged close to the buffer layer 2, the second sacrificial layer 32 is arranged close to the first sacrificial layer 31, the etching speed of the first sacrificial layer 31 is greater than the etching speed of the second sacrificial layer 32, A plurality of parallel grooves 311 are distributed on the first sacrificial layer 31 , and the second sacrificial layer 32 has a plurality of protrusions 321 closely fitting with the grooves 311 . figure 2 yes figure 1 Part or all of the sectional view taken along the line A-A of the solar cell epitaxial wafer shown in , wherein the strip-shaped protrusion 321 of the seco...

Embodiment 2

[0057] Such as Figure 7 As shown, the present embodiment provides a method for manufacturing a solar cell epitaxial wafer, comprising the following steps:

[0058] S1: growing the buffer layer 2 epitaxially on the substrate 1, specifically, metal organic compound chemical vapor phase epitaxy (MOCVD) can be used. The metal-organic compound chemical vapor phase epitaxy technology is currently the most mature epitaxial growth technology with the best effect in the manufacture of III-V compound solar cells. In addition, molecular beam epitaxy (MBE) with a slower growth rate can also be selected.

[0059] S2: epitaxially grow the first sacrificial layer 31 on the buffer layer 2, specifically, metal organic compound chemical vapor phase epitaxy (MOCVD) can be used.

[0060] S3: Make a plurality of parallel strip grooves 311 on the first sacrificial layer 31, or make a plurality of holes 312 on multiple parallel straight lines on the first sacrificial layer 31 and on the same line ...

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Abstract

The invention relates to a solar cell epitaxial wafer and a manufacturing method thereof. The solar cell epitaxial wafer comprises a substrate, a buffer layer, a sacrificial layer and a solar cell layer which are sequentially arranged, wherein the sacrificial layer comprises a first sacrificial layer and a second sacrificial layer, the first sacrificial layer is arranged close to the buffer layer, the second sacrificial layer is arranged close to the first sacrificial layer, the corrosion rate of the first sacrificial layer is greater than the corrosion rate of the second sacrificial layer, a plurality of mutually parallel bar-shaped grooves are distributed on the first sacrificial layer, and the second sacrificial layer is provided with a plurality of bar-shaped bulges which are tightly matched with the bar-shaped grooves. A technical problem that the sacrificial layer is corroded by a corrosive liquid with an unpredictable direction and different speeds is solved. The time of a stripping process can be reduced, and damages of the substrates and the solar cell layer in the stripping process can also be reduced, thereby improving the quality of a solar cell product and the yield of a production line.

Description

technical field [0001] The invention relates to the technical field of solar cells. Specifically, it relates to a solar cell epitaxial wafer and a manufacturing method thereof. Background technique [0002] GaAs solar cell technology is developing rapidly, and its application fields have gradually expanded from space applications to ground applications. It has broad market prospects in the fields of portable energy and consumer electronics. Using epitaxial lift-off technology (ELO technology) to make GaAs solar cells, on the one hand, the GaAs substrate can be reused after peeling off, which can significantly reduce product costs; on the other hand, flexible GaAs solar cells can be made, and the efficiency is not only improved compared to before stripping , and the product is lighter and flexible, which is more conducive to aerospace and portable applications, etc., and has a wide range of uses. [0003] In the prior art, the process of making GaAs solar cells using epitax...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/0304H01L31/18
CPCH01L31/03046H01L31/1844Y02E10/544Y02P70/50
Inventor 黄添懋杨晓杰刘凤全叶继春
Owner SUZHOU JUZHEN PHOTOELECTRIC
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