Standard cell library function testing method with contrasting function
A standard cell library and standard cell technology, applied in error detection/correction, instrumentation, electrical digital data processing, etc., can solve problems such as inability to automatically detect standard cells, many redundant vectors, low test efficiency, etc., and achieve unit test efficiency The effect of improving, increasing vector utilization, and decreasing memory space and cpu occupancy
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[0031] The present invention will be further described below in conjunction with the accompanying drawings.
[0032] Such as figure 1 A schematic diagram of the circuit structure for this test method is shown. The part shown in upper left A is the input vector selection expansion module, whose function is to select and expand the external input or internally generated 6-bit test vector according to the address signal (the test vector is Gray code). The output is used for the standard unit and the control unit. The part shown in B above is the test unit module part, which classifies the units in the unit library according to timing and combination units, and sorts them according to the number of input ports. Connect the sorted unit input terminal with the expanded input vector of part A to receive the test vector. C below shows the control unit module, and the ideal model corresponding to the standard unit is sorted according to the order of the units in B. Also accept test...
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