Multichannel scattering parameter testing circuit and method for complex modulation and phase coherence system
A scattering parameter measurement and phase coherence technology, applied in electrical components, digital transmission systems, data exchange networks, etc., to achieve the effect of small insertion loss
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[0055] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0056] Such as figure 1 As shown, a multi-channel scattering parameter test circuit applicable to complex modulation and phase coherent systems of the present invention includes: a main control computer, a PXI chassis, a shared local oscillator signal generation unit, a shared clock reference generation unit, multi-channel complex modulation and Phase coherent excitation signal generation unit, multi-channel complex modulation and phase coherent excitation sig...
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