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Apparatus and method for testing laser frequency doubling crystal properties

A technology of frequency-doubling crystals and lasers, which is applied in the field of devices for testing the properties of laser frequency-doubling crystals, and can solve problems such as difficult non-destructive detection and difficult measurement

Inactive Publication Date: 2015-05-27
GRINM ELECTRO OPTIC MATERIALS
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Problems solved by technology

At present, it is very difficult to non-destructively detect the microstructure and microscopic defects of laser frequency doubling crystals. It is not only destructive to observe laser frequency doubling crystals with conventional elemental analysis and structure determination methods, but it is also difficult to determine the microstructure and defects.

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  • Apparatus and method for testing laser frequency doubling crystal properties
  • Apparatus and method for testing laser frequency doubling crystal properties

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Embodiment Construction

[0019] The present invention will be described in detail below in conjunction with the accompanying drawings.

[0020] Such as figure 1 As shown, the present invention provides a device for testing the properties of laser frequency doubling crystals, which can test the properties of crystals by using the laser frequency doubling crystals to double the frequency of incident laser light. It includes a laser light source 1 and an incident laser light path 2 arranged in sequence , stage 3, second harmonic laser optical path 4, pinhole 5, incident light color filter 6, photomultiplier tube 7. Wherein, the incident laser optical path 2 and the second harmonic laser optical path 4 respectively include two parallel convex lenses, namely a first convex lens 21 , a second convex lens 22 , a third convex lens 41 and a fourth convex lens 42 . The laser frequency doubling crystal to be tested is placed on the stage 3 and located at the focal point of the second convex lens 22 and the thir...

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Abstract

An apparatus and a method for testing laser frequency doubling crystal properties. The apparatus includes, in a successively arranging manner, a laser source, an incident laser path, an object supporting bench, a secondary harmonic laser path, a pinhole, an incident light color filter and a photoelectric multiplier tube. During test, a laser frequency doubling crystal is irradiated by laser by a property that the laser frequency doubling crystal can frequency-multiplying an incident laser to generate secondary harmonic of the incident laser. An emitted secondary harmonic is received by the photoelectric multiplier tube to obtain light intensity of the secondary harmonic. By means of the apparatus for irradiating different zones in the laser frequency doubling crystal, secondary harmonic intensities in the different zones are obtained. By analyzing the secondary harmonic intensities in the different zones, determination of structure and properties of the laser frequency doubling crystal is carried out. The apparatus and the method can analyze the internal structure of the laser frequency doubling crystal without damage of the laser frequency doubling crystal, thereby achieving non-destructive detection of quality of the laser frequency doubling crystal.

Description

technical field [0001] The invention relates to the technical field of crystal property testing, in particular to a device and method for testing properties of laser frequency doubling crystals. Background technique [0002] The laser confocal scanning microscope can perform three-dimensional scanning imaging of the tested object, and has important applications in the microscopic detection of the internal structure of biological tissues. At present, most of the common laser confocal scanning microscopes are tested by using the fluorescence effect of the tested object, and most of the tested objects are amorphous or polycrystalline. [0003] In recent years, research on frequency-doubling crystals has made significant progress. For single crystal objects with laser frequency doubling effect, there is currently a lack of testing devices and methods for their properties. At present, it is very difficult to non-destructively detect the microstructure and microscopic defects of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/63
Inventor 刘春雷雷同光金攀王瑞臣郝建磊
Owner GRINM ELECTRO OPTIC MATERIALS
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