On-orbit SRAM type FPGA fault detection and restoration method based on configuration frame

Abstract

The invention relates to an on-orbit SRAM type FPGA (field programmable gate array) fault detection and restoration method based on a configuration frame. The method is implemented by a fault detection and restoration system; the fault detection and restoration system comprises a main processing module, a configuration frame read-back module, a fault detection module and a configuration frame error correction and recovery module. By the fault detection and restoration system implemented on a high-reliability chip, reading back, calibration and writing back or rewriting are carried out on configuration information in an SRAM type FPGA according to frames, so that fault detection and restoration on the frame levels of the configuration information is realized; therefore, the detection rate and the restoration capacity for the configuration information turnover problem, caused by a space environment single-particle effect, of the FPGA are greatly improved, and a universal reliability design method which is easy to implement and low in resource consumption rate and does not need software supporting is provided for the SRAM type FPGA.

Description

technical field [0001] The invention relates to an on-orbit SRAM type FPGA fault detection and repair method based on a configuration frame, and belongs to the technical field of satellite control systems. Background technique [0002] With the development of the aerospace industry, miniaturization and system integration have become the main trend of satellite development, which requires the electronic components used must have the characteristics of high integration and small size, which makes Field Programmable Gate Array FPGA (Field Programmable Gate Array) has become the main device of satellite electronic products. [0003] In space applications, the most used FPGA is based on the CMOS SRAM process, but when the SRAM FPGA is used in the space environment, space high-energy particles will penetrate the interior of the FPGA device and generate ionization on the path, and the internal circuit nodes will be due to The diffusion and drift of electrons or holes generated by ...

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Problems solved by technology

[0004] The object of the present invention is to overcome the above-mentioned deficiency of prior art, provide a kind of SRAM type FPGA fault detection and repair method based on configuration frame, this method makes up for the deficiency of SRAM type FPGA space anti-radiation ability, solves the problem of SRAM type FPGA Because the configuration information is too large, it is impossible to quickly and flexibly realize fault detection and repair, etc., providing a general reliability design method for SRAM FPGA with simple implementation, low resource consumption rate, and no software support

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