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Temperature uniformity measurement and control system for low-temperature vacuum microwave radiation source

A technology of microwave radiation and low-temperature vacuum, applied in temperature control, optical radiation measurement, radiation pyrometry, etc., can solve the problems of microwave radiation value deviation, microwave radiation source temperature measurement error, and damage to radiation source temperature balance, etc., to achieve Effects of improving temperature measurement accuracy and improving radiation accuracy

Inactive Publication Date: 2015-04-29
SHANGHAI INST OF SATELLITE EQUIP
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AI Technical Summary

Problems solved by technology

[0002] The common method of calibrating the temperature of microwave radiation source is to install contact platinum resistance thermometers on the back of the radiation surface and other places. This contact measurement method destroys the original temperature balance of the radiation source, and due to the Due to the error of the resistance thermometer and other reasons, there is a certain error in the temperature measurement of the microwave radiation source, and the measurement error of the temperature will directly affect the accuracy of the microwave radiation, resulting in deviation of the microwave radiation value.

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  • Temperature uniformity measurement and control system for low-temperature vacuum microwave radiation source
  • Temperature uniformity measurement and control system for low-temperature vacuum microwave radiation source
  • Temperature uniformity measurement and control system for low-temperature vacuum microwave radiation source

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Embodiment Construction

[0020] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0021] Such as Figure 1-3 As shown, the embodiment of the present invention provides a non-contact temperature measurement unit 2, a two-dimensional scanning unit 3 and peripheral data acquisition control units 4 and 5, and the non-contact temperature measurement unit 2 includes a measurement unit installation shell 7 and an optical system , the optical path system includes a stray light stop 8, an aperture stop 9, a plane mirror 10, an off-axis parabolic mirror 11, a frequency modulator 12, a be...

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Abstract

The invention provides a temperature measurement and control system for a microwave radiation source used under low-temperature vacuum conditions. The temperature measurement and control system comprises a non-contact temperature measurement unit, a two-dimensional scanning unit and a peripheral data acquisition control unit, wherein the non-contact temperature measurement unit comprises a measurement unit mounting shell and a light path system; the light path system comprises a stray light elimination diaphragm, an aperture diaphragm, a plane mirror, an off-axis parabolic mirror, a frequency modulator, a light splitting sheet, a light beam collector, an MTC detector, a light beam collector and a medium wave infrared InSb detector. The temperature measurement and control system has the functions of simple structure, high generality, high temperature measurement accuracy, online real-time monitoring and the like, the radiation accuracy and the uniformity of the microwave radiation source can be effectively improved, and the system has great significance for improvement of the calibration accuracy of aerospace microwave loads.

Description

technical field [0001] The invention relates to the field of optical radiation temperature measurement and control, in particular to a measurement and control system for temperature and uniformity of a microwave radiation source and temperature feedback control in a low-temperature vacuum environment. Background technique [0002] The common method of calibrating the temperature of microwave radiation source is to install contact platinum resistance thermometers on the back of the radiation surface and other places. This contact measurement method destroys the original temperature balance of the radiation source, and due to the Resistance thermometer errors and other reasons lead to certain errors in the temperature measurement of microwave radiation sources, and temperature measurement errors will directly affect the accuracy of microwave radiation, resulting in deviations in the value of microwave radiation. Therefore, it is necessary to use higher-precision temperature mo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/10G01J5/08G01J5/06G05D23/27
Inventor 徐骏傅立刘刚蓝天翔谢建华肖育
Owner SHANGHAI INST OF SATELLITE EQUIP
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