Improved optimizing method for sequential fault diagnosis strategy
An optimization method and fault diagnosis technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems such as inability to use diagnostic experience, low uncertainty processing ability, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0068] Taking an electronic device as an example, first use TEAMS software to establish a multi-signal model of the device, and obtain its fault-test correlation matrix as shown in Table 1, t 1 ~t 4 For 4 test points, f 1 ~ f 10 represent 10 fault sources respectively.
[0069] Table 4.1 Failure-Test Correlation Matrix
[0070]
[0071]
[0072] assuming t 1 ~t 4 The test costs are respectively C=[2, 6, 4, 3], and the quantified values of test difficulty are Θ=[1, 3, 5, 2] (according to expert experience), f 1 ~ f 10 The failure rates are P=[0.02, 0.01, 0.005, 0.03, 0.08, 0.04, 0.006, 0.001, 0.008, 0.01] respectively. Using the improved ant colony method to formulate a diagnosis strategy for the inertial measurement combination, the model parameters are M=10, α=1, β=4, α 0 = 1.2, α 1 =0.8,β 0 =5,β 1 = 3, ρ = 0.1, T = 50, τ min = 1, R = 3, t p = 30, σ = 0.7. After calculating the average value for 30 times, the optimal sequential diagnosis strategies of th...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com