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Method for determining edge of overlapping region of color filtration blocks and black matrix

An overlapping area and color filter technology, which is applied in the testing, installation, and optics of machine/structural components, can solve the problem of changing the width of the overlapping area, inappropriate light intensity, and the inability to accurately determine the color filter block and Problems such as the edge of the overlapping area of ​​the black matrix, to achieve the effect of easy operation, improved accuracy and stability

Active Publication Date: 2015-03-25
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a method for determining the edge of the overlapping area between the color filter block and the black matrix, so as to solve the problem that the light intensity is not suitable or the width of the overlapping area changes, and it is impossible to accurately determine the color filter block and the black matrix. Problems with the edges of overlapping areas of the black matrix

Method used

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  • Method for determining edge of overlapping region of color filtration blocks and black matrix
  • Method for determining edge of overlapping region of color filtration blocks and black matrix
  • Method for determining edge of overlapping region of color filtration blocks and black matrix

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Embodiment 1

[0053] An embodiment of the present invention provides a method for determining the edge of the overlapping area between the color filter block and the black matrix, such as Figure 8 , the method includes:

[0054] Step S102, acquiring the measurement area to be detected including the color filter block, the black matrix and their overlapping areas.

[0055] Step S102, draw the original gray scale value curve and the differential gray scale value curve of the measurement area to be detected, and determine the extreme value of the differential gray scale value curve according to the preset extreme value range.

[0056] Step S103 , according to the gray scale values ​​of the color filter blocks and the black matrix in the measurement area to be detected, combined with the first preset rule, the gray scale value of the overlapping area between the color filter blocks and the black matrix is ​​acquired.

[0057] Step S104 , according to the grayscale values ​​of the color filter...

Embodiment 2

[0061] In the embodiment of the present invention, when executing Figure 8 Before the method shown, it is necessary to determine the reference area and determine some reference values ​​according to the reference area. The specific steps are as follows Figure 9 Shown:

[0062] Step S201 , on the same color filter substrate, determine a reference area, the reference area includes a color filter block of a different color, and determine a matching area of ​​the reference area.

[0063] Specifically, the reference area is an area where the light intensity selected on the color filter substrate is appropriate and the width of the overlapping area 2 around each color filter block 1 is basically the same, such as figure 1 shown. The matching area 7 determined in the reference area is as figure 1 As shown in , it includes a region corresponding to a thin film transistor on the array substrate. The determination of the matching area 7 is beneficial to obtain an area to be detect...

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Abstract

The invention discloses a method for determining the edge of an overlapping region of color filtration blocks and a black matrix, and belongs to the technical field of display. The method is used for solving the problem that because light intensity is not suitable or the width of the overlapping region changes, the edge of the overlapping region of the color filtration blocks and the black matrix can not be determined accurately. The method for determining the edge of the overlapping region of the color filtration blocks and the black matrix comprises the steps that an original gray-scale value curve and a difference gray-scale value curve of a measurement region to be detected are drawn, and extreme values of the difference gray-scale value curve are determined according to a preset extreme value range; through combination with a first preset rule, the gray-scale value of the overlapping region between the color filtration blocks and the black matrix is obtained; through combination with a second preset rule, threshold values are built; two intersection points of the threshold values and the original gray-scale value curve are obtained, two extreme values, closest to the two intersection points, on the difference gray-scale value curve are obtained, and the edge of the overlapping region of the color filtration blocks and the black matrix is determined.

Description

technical field [0001] The present invention relates to the field of display technology, in particular to a method for determining the edge of an overlapping area between a color filter block and a black matrix. Background technique [0002] In the production process of color filter (CF) substrates, in order to prevent light leakage or overlap between adjacent color filter blocks, the size of the color filter blocks and their intersection with the black matrix should be strictly controlled. The size of the overlapping area. The method for determining the overlapping area currently adopted in the industry mainly utilizes the difference in gray scale values ​​at the edge of the color filter block and the black matrix. Specifically, the edge of the overlapping area can be positioned through the following steps: [0003] Such as figure 1 As shown, a charge-coupled device (CCD for short) is used to image the region to be detected, and the region to be detected includes one col...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/1335
CPCG02F1/1309G02F1/1335G02B5/003G02B5/22G02B7/003G02F1/133512G02F1/133514G01M11/00G09G3/2007G09G2310/027
Inventor 史凯陈林豆
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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