Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Leakage current detection method and device

A leakage current detection and leakage current technology, which is used in measurement devices, electronic circuit testing, marginal circuit testing, etc., can solve problems such as limited detection ratio, failure, and difficulty in stable leakage current testing, and achieve high detection accuracy and detection efficiency. The effect of high and large detection ratio

Inactive Publication Date: 2015-02-11
HUAWEI TECH CO LTD
View PDF5 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Since the leakage current is generally at the level of 10*E-9A, it is difficult to test the leakage current stably in the usual on-board device electrical qualification test.
Moreover, this method is mainly used in incoming quality control (Incoming Quality Control, IQC) incoming sampling inspection and ex-factory inspection, and batch inspection cannot be realized, and the inspection ratio is limited.
[0006] In addition, the above test methods can only test isolated devices. After the device is mounted on the board, leakage current detection will no longer be possible. When testing is required, the device must be removed from the board before detection can be performed, resulting in Most of the devices with leakage current problems flow into the market and cause single board functional failure

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Leakage current detection method and device
  • Leakage current detection method and device
  • Leakage current detection method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0056] figure 2 Is a flowchart of a leakage current detection method provided by an embodiment of the present invention, such as figure 2 As shown, the method is applied to the leakage current detection of on-board devices on a printed circuit board assembly (PCBA) board. The method includes:

[0057] Step S110: Connect the leakage input terminal of the device under test to the voltage supply module, and connect the leakage output terminal to the resistance test module.

[0058] Specifically, the tested on-board device is an on-board isolated device, that is, an on-board device that is not connected to any other devices. For the isolated device on the board, in the single-board PCB design stage, a test point is respectively arranged at the leakage input end and the leakage output end of the isolated device on the board in advance. For devices with multiple pins, two pins can be selected as the leakage input terminal and the leakage output terminal according to actual needs. For...

Embodiment 2

[0082] Figure 4 Is a flowchart of a leakage current detection method provided by another embodiment of the present invention, such as Figure 4 As shown, Figure 4 The illustrated embodiment is the same as figure 2 The main difference of the illustrated embodiment is Figure 4 The illustrated embodiment is used to detect the leakage current of an on-board device connected to other devices, and the method mainly includes:

[0083] Step 210: Isolate the device under test from other connected devices.

[0084] The purpose of isolation is to eliminate the bypass influence of other connected devices on the device under test, and to ensure that the current flowing through the second resistor R2 is 0, that is, to ensure I 2 =0 (such as Figure 5 Shown), and makes I X =I ref .

[0085] In this embodiment, isolation is performed in the following manner.

[0086] Such as Figure 5 As shown, other devices connected to the leakage input end of the device under test Rx are equivalent to the firs...

Embodiment 3

[0097] Image 6 It is a schematic structural diagram of a leakage current detection device provided by an embodiment of the present invention, such as Image 6 As shown, the device 100 includes a voltage providing module 11, a resistance testing module 12, and a control module 13.

[0098] Among them, the voltage supply module 11 is connected to the leakage input end of the device under test 14 to provide a fixed voltage relative to the reference ground for the device under test 14; the resistance test module 12 is connected to the leakage current of the device under test 14 The output terminal is used to provide a reference resistance; the control module 13 is connected to the resistance test module 12 and the voltage supply module 11, and is used to calculate the leakage current flowing through the measured on-board device 14 according to the output voltage of the resistance test module 12 and the reference resistance.

[0099] The on-board device 14 to be tested in this embodimen...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A leakage current detection method and device. The method is used to detect a leakage current of an on-board device on a PCBA board, and comprises: providing a fixed voltage for the leakage current input end of an on-board device under detection, and connecting the leakage current output end of the on-board device under detection to the inverting input end of an operational amplifier of a resistance test module, the resistance test module comprising the operational amplifier and a reference resistor which is connected between the inverting input end of the operational amplifier and the leakage current output end; detecting an output voltage of the resistance test module; and based on Ohm's law, according to the output voltage and reference resistance, calculating a leakage current flowing through the on-board device under detection. The on-board device under detection is connected to the resistance test module, and a certain voltage is applied thereto, so that the leakage current of the on-board device on the PCBA board can be calculated according to the reference resistance of the resistance test module and the output voltage of the operational amplifier. The batch detection can be achieved without removing the on-board device from a single board, so that the detection accuracy is high, the detection efficiency is high, and the detection ratio is large.

Description

Technical field [0001] The invention relates to the technical field of leakage current detection, in particular to a leakage current detection method and device. Background technique [0002] Leakage current refers to the very tiny current flowing through semiconductor components when the PN junction is off or the capacitor is fully charged. It is also called Ir leakage current. Leakage current is the inherent characteristics and important performance indicators of semiconductor components, filters, power supplies and capacitors. Damage to the surface of the device and cracking of the wafer caused by the manufacturer's process abnormalities, raw material contamination, and internal management problems often lead to excessive device leakage current. [0003] When the device just leaves the factory, potential stress, cracks and pollution will not directly show abnormal leakage current. The initial leakage current usually does not directly affect the product function. Therefore, the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R19/00
CPCG01R31/2812G01R31/2813G01R31/3008G01R31/52
Inventor 朱青松颉陆军
Owner HUAWEI TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com