Performance degradation monitoring system for photovoltaic cell

Abstract

The invention discloses a performance degradation monitoring system for a photovoltaic cell. The system comprises a testing light source module, an I-V curve detection module, a channel switching module, a load loading module, a communication control unit and a processing terminal, wherein the I-V curve detection module detects a volt-ampere characteristic curve outwards output by the photovoltaic cell device; the processing terminal calculates the optimal load value of the maximum power point of the photovoltaic cell device according to the volt-ampere characteristic curve detected by the I-V curve detection module; the load loading module loads a load resistor of the corresponding resistance on the photovoltaic cell device according to the optimal load value. The load obtained by calculation is loaded on the detected photovoltaic cell device through the load loading module, and therefore the photovoltaic cell device does work outwards all the time in the testing process, the process better accords with actual situations of the photovoltaic cell device in the actual working process, and the degradation of the device in the actual working state is simulated more objectively and accurately.

Description

technical field [0001] The invention relates to the field of photovoltaic cells, in particular to a real-time monitoring system for performance attenuation of photovoltaic cell devices. Background technique [0002] As a clean and sustainable energy source, solar energy is gaining widespread attention. In order to make solar cell devices cheaper, in addition to improving their photoelectric conversion efficiency and reducing manufacturing costs, improving the stability of solar cell devices and prolonging their life are also important research directions. [0003] At present, the stability and service life of photovoltaic cells are usually characterized by reliability testing methods, that is, the photovoltaic cells to be tested are placed in relatively harsh test environments, such as high temperature and high humidity conditions, and the test devices are tested under accelerated aging conditions. changes in device performance. Such a detection method is relatively simple...

AI Technical Summary

Problems solved by technology

However, the above-mentioned system cannot track the maximum power output point of the device in real time, so the device is actually in an open circuit state, so it cannot accurately characterize the performance degradation process of the photovoltaic device under the actual working state

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