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50% duty ratio clock generation circuit

A clock generation circuit and duty cycle technology, applied in the direction of generating electrical pulses, pulse generation, electrical components, etc., can solve the problems of the output phase being unable to be locked, the periodic error of the output clock signal duty cycle, and the phase jitter, etc. Small design difficulty and power consumption, the effect of improving the signal-to-noise ratio

Active Publication Date: 2014-10-22
XIDIAN UNIV
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Problems solved by technology

At the same time, due to the existence of parasitic capacitance, it takes a certain amount of time for the circuit to generate UP and DOWN signals, which results in that when the input phase difference is less than a certain value, the charge pump cannot inject current, then the entire loop gain is zero, and the output phase cannot Locking, the very small phase difference between CLKIN and CLKOUT cannot be recognized, that is to say, there will be a dead zone near the phase equal to zero between the loop filter and the charge pump, which will cause phase jitter and cause the output clock Signal Duty Cycle Periodic Error

Method used

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[0043]In order to make the technical problems, technical solutions and advantages to be solved by the present invention clearer, the following will describe in detail with reference to the drawings and specific embodiments.

[0044] The present invention aims at the problem that the two-phase non-overlapping clocks of the quantizer in the analog-to-digital conversion circuit do not have the same pulse width, and the working speed of the quantizer is low, and provides a 50% duty ratio clock The generating circuit converts the differential clock signal into a single-ended clock signal through a low-noise amplification buffer circuit, and modulates the duty ratio of the single-ended clock signal to generate a clock signal with a duty ratio of 50%, which reduces the The design difficulty and power consumption of the sample-and-hold circuit in the digital conversion circuit improve the signal-to-noise ratio (SNR) and clutter-free dynamic range (SFDR) of the analog-to-digital convers...

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Abstract

The invention provides a 50% duty ratio clock generation circuit, and relates to the field of digital-analog hybrid integrated circuit design. The circuit comprises a low-noise amplification buffer circuit and a duty ratio modulation circuit. The low-noise amplification buffer circuit is used for amplifying an externally inputted differential clock signal so that a single-end clock signal is generated and outputted to the duty ratio modulation circuit. The duty ratio modulation circuit is used for modulating duty ratio of the single-end clock signal so that a clock single with duty ratio of 50% is generated. The differential clock signal is converted into the single-end clock signal by the circuit via the low-noise amplification buffer circuit, duty ratio of the single-end clock signal is modulated and clock single with duty ratio of 50% is generated so that design difficulty and power consumption of a sampling and holding circuit in an analog-to-digital conversion circuit are reduced, and signal-to-noise ratio (SNR) and a spurious free dynamic range (SFDR) of an analog-to-digital conversion quantizer are enhanced.

Description

technical field [0001] The invention relates to the field of digital-analog hybrid integrated circuit design, in particular to a 50% duty ratio clock generation circuit. Background technique [0002] With the continuous development and shrinking of complementary metal oxide semiconductor (CMOS) technology, people's demand for high-speed, high-precision and high-integration integrated circuits is growing rapidly. However, the synchronization between IC modules becomes one of the bottlenecks in high-performance systems. In these systems, the signal-to-noise ratio is one of the important measures of system performance. The noise in the clock circuit will be transmitted to the whole system, thereby affecting the signal-to-noise ratio of the whole system, and even affecting the performance of the whole system. At the same time, for a high-performance analog-to-digital converter, the settling time of the quantizer is more demanding. Since the circuit in the quantizer works in tw...

Claims

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Application Information

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IPC IPC(8): H03K3/017
Inventor 甘萍朱樟明刘马良杨银堂张鹏
Owner XIDIAN UNIV
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