Molybdenum disulfide/silicon heterogeneous film component with hydrogen sensitivity effect as well as preparation method and application thereof
A technology of molybdenum disulfide and thin-film devices, which is applied in the direction of instruments, scientific instruments, measuring devices, etc., can solve problems such as resistance changes, and achieve the effects of high reliability, elimination of dependencies, and simple preparation process
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[0027] The present invention utilizes DC magnetron sputtering technology to deposit MoS on Si semiconductor substrate 2 thin film layer, thus forming the MoS 2 / Si heterojunction. When exposed to H 2 atmosphere, due to the H 2 Adsorption occurs, MoS 2 The carriers and Fermi levels of the film are changed, which leads to the MoS 2 The junction resistance of the / Si heterojunction changes significantly, so that the prepared MoS 2 / Si heterojunction pair H 2 Demonstrates a noticeable responsiveness.
[0028] Next to MoS 2 / Si heterogeneous thin film device structure, preparation method and application are described in detail.
[0029] MoS of the present invention 2 / Si heterogeneous thin film structures, including MoS 2 Semiconductor thin film layer and Si semiconductor substrate, MoS 2 The thin film layer is arranged on the surface of the Si substrate. The Si substrate is a p-type Si single crystal substrate with a resistivity of 1-10Ωcm -1 , the crystal orientation...
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