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High-sensitivity cmos image sensor shared pixel structure

An image sensor and high-sensitivity technology, which is applied in the field of image sensors, can solve the problems of low photosensitive sensitivity of pixels and reduce photoelectric conversion gain, etc., and achieve the effect of improving photosensitive sensitivity and photoelectric conversion gain

Active Publication Date: 2017-03-15
BEIJING SUPERPIX MICRO TECHNOLOGY CO LTD
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] The larger n in the above equation, the more transistors the pixel saves on average, and the more the photodiode area of ​​the pixel is enlarged, the higher the pixel sensitivity will be; however, the larger n in the equation, the total floating active area The higher the capacitance CFDn, the lower the photoelectric conversion gain and the lower the photosensitive sensitivity of the pixel, which is contrary to the original intention of increasing the photosensitive sensitivity by enlarging the photodiode area.

Method used

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specific Embodiment approach

[0019] High-sensitivity CMOS image sensor sharing type pixel structure of the present invention, its preferred embodiment is:

[0020] Including a plurality of photodiodes and the same number of charge transfer transistors and a first floating active area, and also includes a reset transistor, a source follower transistor, a row selection transistor and a second floating active area, the first floating active area The region is separated from the second floating active region by a switch transistor.

[0021] The drain of the switch transistor is connected to the second floating active region, and the source is connected to the first floating active region.

[0022] The gate of the source follower transistor is connected to the second floating active area, and the source follower transistor is used to detect the potential signal change of the second floating active area.

[0023] In the shared pixel structure of the high-sensitivity CMOS image sensor, the number of pixels incl...

specific Embodiment

[0030] In the embodiment of the present invention, the four-pixel sharing structure of a CMOS image sensor is taken as an example. In this pixel structure, Pin-type N-type photodiodes are used, and transistors in the pixels are N-type transistors.

[0031] Such as figure 2 As shown, it includes photodiodes 201-204 of four pixels in a shared structure, charge transfer transistors 205-208 in four pixels, reset transistor 209, source follower transistor 210, row selection transistor 211, column bit line 212, switching transistor 213; the gate terminals of the charge transfer transistors 205-208 are respectively TX1, TX2, TX3 and TX4, the gate terminals of the reset transistor 209 and the row selection transistor 211 are RX and SX, the gate terminals of the switch transistor 213 are TX, and Vdd is the power supply voltage ; FD4 is the first floating active area, FD is the second floating active area, C1 is the overlapping capacitance of FD and TX, C2 is the overlapping capacitanc...

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Abstract

The invention discloses a sharing type pixel structure of a high-sensitivity CMOS image sensor. The sharing type pixel structure of the high-sensitivity CMOS image sensor comprises a plurality of photodiodes, charge transfer transistors and a first floating active area, wherein the number of the photodiodes is the same as the number of the charge transfer transistors. The sharing type pixel structure of the high-sensitivity CMOS image sensor further comprises a reset transistor, a source following transistor, a column selection transistor and a second floating active area. The first floating active area and the second floating active area are spaced through a switch transistor. The source following transistor detects a potential signal of the second floating active area. The stray capacitance of the second floating active area does not change along with the number of shared pixels. By the sharing type pixel structure, the photovoltaic conversion gains of the shared pixels are effectively increased, and the luminous sensitivity of the CMOS image sensor with the sharing type pixel structure adopted is effectively improved.

Description

technical field [0001] The invention relates to an image sensor, in particular to a shared pixel structure of a high-sensitivity CMOS image sensor. Background technique [0002] Image sensors have been widely used in digital cameras, mobile phones, medical devices, automobiles and other applications. In particular, the rapid development of the technology for manufacturing CMOS (Complementary Metal Oxide Semiconductor) image sensors has made people have higher requirements for the output image quality of the image sensor. [0003] CMOS image sensors in the prior art, especially CMOS image sensors using small-area pixel units, generally use a shared pixel structure, such as sharing two pixels, sharing four pixels, or sharing more pixels. The important reason for using pixel sharing is to save transistors in order to expand the area of ​​the photodiode, thereby improving the photosensitivity of the pixel; however, this way of improving photosensitivity sacrifices the photoelec...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/374H01L27/146
Inventor 郭同辉唐冕旷章曲
Owner BEIJING SUPERPIX MICRO TECHNOLOGY CO LTD
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