Lamp head tin scolding contact qualified rate detecting device and method

Abstract

The invention discloses a lamp head tin scolding contact qualified rate detecting device and a method. The lamp head tin scolding contact qualified rate detecting device comprises a rotating disk, a rotating disk stopping baffle plate position detector, lamp position fixing clamps, a pedestal support, a video image acquisition device, an image processing subsystem, and a liquid crystal display screen; the rotating disk is used for delivering lamps to be detected at certain time intervals with certain distance; the rotating disk stopping baffle plate position detector is used for determining settled rotating distance of the rotating disk; the lamp position fixing clamps are used for settling orientation and distance of the lamps; the video image acquisition device is used for completing acquisition and sending of image data of a top view and a right lateral view; the image processing subsystem is used for processing and determining of real-time imagines via certain detecting algorithm; and the liquid crystal display screen is used for displaying finished results. The lamp head tin scolding contact qualified rate detecting device is capable of solving problems of artificial naked eye discrimination that labor cost is high, fatigue is caused easily, and detection accuracy rate is low; detection can be carried out for 24 hours; labor cost is reduced; and detection efficiency and accuracy rate are increased at the same time.

Description

technical field [0001] The invention relates to the field of solder contact detection, in particular to a device and method for detecting the pass rate of solder contact of a light bulb head. Background technique [0002] The incandescent lamp assembly line technology has been put into factory operation in my country for nearly 30 years, and the technical realization is mostly mechanical devices, lacking the integration of information technology in the new era. In the follow-up process of incandescent lamp production, there is a process of cutting and soldering the leaking guide wire of the bulb head. The mechanical assembly line lacks timely product qualification testing, and the cutting of the guide wire depends entirely on the accuracy of the mechanical device. However, with the aging of the bulb assembly line, the accuracy of the machine decreases, and the problem of unqualified guide wire cutting occurs. At present, the detection of solder contacts of incandescent lam...

AI Technical Summary

Problems solved by technology

The duration of manual inspection is short, the overall detection and identification efficiency is low, and the selection of defective products is not timely enough

And additional stations are required for testing, which increases the cost of factory management

At the same time, the work is monotonous and repetitive, the naked eye is prone to fatigue, and the continuous concentration of manual detection is poor, which greatly affects the detection effect

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