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A basic performance test method for the operating environment of an enterprise eda design platform

A technology of operating environment and testing method, applied in calculation, error detection/correction, instrumentation, etc., can solve problems such as single type, load deviation, and difficulty in comprehensively measuring work performance

Active Publication Date: 2016-08-31
SUZHOU HUAXIN MICROELECTRONICS
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

Its advantage is that it can help users analyze and understand the performance of certain characteristics of the file system from a microscopic point of view, and the test results are concise and clear; but the disadvantages are: it is easy to cause low test coverage, and microscopic tests on individual hardware reflect Performance is difficult to comprehensively measure the actual working performance of the overall system
Its advantage is that it can simulate typical real-world requirements from a perspective similar to the actual load; however, this method also has problems such as single type, load deviation, and inflexible configuration

Method used

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  • A basic performance test method for the operating environment of an enterprise eda design platform
  • A basic performance test method for the operating environment of an enterprise eda design platform
  • A basic performance test method for the operating environment of an enterprise eda design platform

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Embodiment Construction

[0065] The technical solution of the present invention will be further described below in conjunction with a preferred embodiment.

[0066] A kind of enterprise EDA design platform operating environment basic performance testing method that this preferred embodiment relates to, it comprises the steps:

[0067] 1) The two-way bandwidth test of the basic read operation and write operation of the platform operating environment, that is, to test by simulating the virtual scene of multiple data interface operations that may occur during the design process;

[0068] 2) Design operation throughput test, that is, test the data file operation throughput of the EDA design platform operating environment through the cross-loop operation mode;

[0069] 3) Typical application simulation test of integrated circuit design, that is, to test the effective application performance of this platform operating environment under the actual integrated circuit design work conditions of enterprises by b...

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Abstract

The invention discloses a basic performance test method for an EDA (electronic design automation) design platform of an enterprise. The method includes the steps: 1) two-directional bandwidth testing of basic read operation and write operation of an operating environment of the platform; 2) testing of designed operation throughput; 3) simulated testing of typical applications of integrated circuit design. The basic performance test method is used for assisting users in microscopically analyzing and understanding performances on certain characteristic aspect of file systems, and testing results are concise.

Description

technical field [0001] The invention relates to a basic performance testing method of an enterprise EDA design platform operating environment. Background technique [0002] At present, there is no standard method for performance testing of EDA design platform systems. Generally, similar to the testing methods for system application platform performance, they mainly focus on benchmarking methods, that is, adopt methods and tools that conform to certain theoretical verification rules. And the system, so as to carry out quantitative test and comparable test on the relevant performance indicators of a certain type of test object. Among them, the benchmark test can be divided into three types: micro test, macro test and trace reproduction method. [0003] Micro testing is mainly aimed at testing one or more specific operational performances of the system under test, and its test load is usually composed of different types of operations to verify a certain aspect or characteristi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/28
Inventor 徐君怡江石根
Owner SUZHOU HUAXIN MICROELECTRONICS
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