Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Array type temperature measuring device and temperature measuring method

A temperature measuring device and array technology, applied in the field of infrared temperature measurement, can solve the problems of unbalanced measurement range, measurement result error, small measurement range, etc., and achieve the effects of improving temperature measurement accuracy, strong practicability, and wide application range

Inactive Publication Date: 2018-03-27
NORTH CHINA UNIVERSITY OF TECHNOLOGY
View PDF7 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, the existing infrared temperature measurement device only measures the temperature at a single point during measurement, the measurement range is small, and the accuracy is not high, and when the object to be measured moves, the measurement result will be large due to the imbalance of the measurement range. error

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Array type temperature measuring device and temperature measuring method
  • Array type temperature measuring device and temperature measuring method
  • Array type temperature measuring device and temperature measuring method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0020] Such as figure 1 , 2 As shown, the array temperature measurement device disclosed in the present invention includes an array temperature measurement module and a parallel processor. The array temperature measurement module is composed of a number of temperature measurement and detection elements arranged in an N*M array. The signal output terminal of the detection unit is connected with the parallel input terminal of the parallel processor.

[0021] The N*M temperature measurement and detection elements that make up the array temperature measurement module collect the temperature signals of the measured object at the same time, and transmit the N*M temperature signals to the parallel processor, and the parallel processor calculates according to the collected multiple temperature signals The average temperature value is used as the tem...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an array type temperature measuring device and a temperature measuring method. The array type temperature measuring device comprises an array type temperature measuring moduleand a parallel processor. The array type temperature measuring module is formed by a plurality of temperature measuring detection elements arranged and combined in an N*M array form. N*M temperature signals collected by N*M temperature measuring detection units are parallel-input into the parallel processor. The parallel processor removes the maximum and minimum extreme values of the N*M temperature signals collected each time, then calculates the average value, and finally, performs weighted averaging on multiple average values to obtain a temperature measured value. The array type temperature measuring module is disposed in an array type lens. The array type lens is composed of a plurality of lens modules arranged and combined in an N*M array form, and each temperature measuring detection element is correspondingly disposed in one lens module. According to the invention, the temperature measurement range can be expanded, the accuracy of temperature measurement is improved, and the range of application is wide.

Description

technical field [0001] The invention relates to an array type temperature measuring device and a temperature measuring method, belonging to the technical field of infrared temperature measurement. Background technique [0002] At present, the existing infrared temperature measurement device only measures the temperature at a single point during measurement, the measurement range is small, and the accuracy is not high, and when the object to be measured moves, the measurement result will be large due to the imbalance of the measurement range. error. At the same moment, multi-point measurement can make up for the lack of single-point measurement of a single camera Contents of the invention [0003] In view of the above reasons, the object of the present invention is to provide an array temperature measuring device and a temperature measuring method. Through the array temperature measuring module, multi-point temperature measurement can be performed on the measured objects w...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00G01K3/06
CPCG01J5/00G01J2005/0077G01J2005/0092G01K3/06
Inventor 邹建成张赛
Owner NORTH CHINA UNIVERSITY OF TECHNOLOGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com