Hardware Trojan horse detection method and system based on supply current

Abstract

The invention provides a hardware Trojan horse detection method and system based on supply current. The hardware Trojan horse detection method comprises the following steps that a test vector group is applied to a golden IC, the supply current is tested at the power supply end of the golden IC to obtain quiescent current data and transient current data of the golden IC, and a threshold line is determined on the basis of the data, wherein the golden IC is an IC without a hardware Trojan horse; the test vector group is applied to a chip to be detected, and the supply current is tested at the power supply end of the chip to be detected to obtain quiescent current data and transient current data of the chip to be detected; whether the chip to be detected has the Trojan horse or not is judged according to the threshold line, the quiescent current data of the chip to be detected, and the transient current data of the chip to be detected. The invention further provides the corresponding hardware Trojan horse detection system. According to the hardware Trojan horse detection method and system based on the supply current, the test process is simple, the test time is short, and the test result is accurate.

Description

technical field [0001] The invention relates to the technical field of integrated circuit detection, in particular to a power supply current-based hardware Trojan detection method and a power supply current-based hardware Trojan detection system. Background technique [0002] Integrated Circuit (IC, Integrated Circuit) / chip has been deeply applied to various fields of national production and life. At present, in order to shorten the chip design cycle and reduce costs, chip design uses third-party EDA (Electronic Design Automation, design automation) tools and third-party IP (Intellectual Property) cores, chip manufacturing generally adopts the foundry method, globalization and IC Rapid improvements in manufacturing processes have led to the fact that IC supply chains that were previously located in one country may now be distributed around the world. These circumstances lead to the fact that the design and manufacture of the chip are not completely controllable, and there m...

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Problems solved by technology

However, this method is susceptible to process fluctuations and test noise. The test noise can be eliminated by obtaining the average value of multiple measurements. However, process fluctuations are inherent and cannot be eliminated by multiple tests. Small, the difference in bypass signals (such as current, power consumption, delay, etc.) between the Trojan chip and the original chip is easily overwhelmed by process fluctuations, which have a greater impact and reduce accuracy

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