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Judgment method for detecting defects of wave absorption coating by using pulse infrared thermal waves

A technology of infrared thermal wave and wave absorbing coating, which is used in optical testing for flaws/defects, etc.

Active Publication Date: 2014-03-12
AEROSPACE RES INST OF MATERIAL & PROCESSING TECH +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Other methods, such as enhancing the image signal-to-noise ratio and image contrast, neural network and pulse phase heat map analysis methods, etc. are also commonly used methods, but there is no good defect judgment method that can be applied to the structure detection of wave-absorbing coatings.

Method used

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  • Judgment method for detecting defects of wave absorption coating by using pulse infrared thermal waves
  • Judgment method for detecting defects of wave absorption coating by using pulse infrared thermal waves
  • Judgment method for detecting defects of wave absorption coating by using pulse infrared thermal waves

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Experimental program
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Embodiment

[0032] For coating structures, simply use figure 1 Indicated, the three main defect forms of the coating structure are depicted from left to right in the figure: surface damage, internal pores and debonding between the coating and the substrate.

[0033] figure 2 It is a schematic diagram of the pulsed infrared thermal wave technology used in the detection of wave-absorbing coatings of the present invention, and it is also a structural schematic diagram of an actual system applying the method of the present invention.

[0034]The process of using the pulse thermal imaging method to detect the wave-absorbing coating will be described below in conjunction with an embodiment. A standard sample of absorbing coating is used in this embodiment, its structure is as follows image 3 As shown, the coating thickness is designed to be 1mm, but the actual thickness is slightly larger than 1mm.

[0035] refer to image 3 , the high-energy flash lamp applies visible light energy to the...

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Abstract

The invention relates to a judgment method for detecting defects of a wave absorption coating by using pulse infrared thermal waves and belongs to the technical field of nondestructive inspection. According to the judgment method, heating equipment for stimulating a test piece to be detected can be a high-energy flash lamp or other pulse type heating equipment; a high-energy flash lamp or other pulse type heating equipment with relatively short pulse acting time is suitable for being adopted; the collection frequency of a thermal imaging device is relatively high and the collection time is set according to the specific property of a material of the test piece to be detected. According to the judgment method, firstly, a standard test piece with a common defect type needs to be selected to be subjected to an experiment; thermal diffusion characteristics are extracted and defect judgment criteria are established to realize the judgment on different defect types; when the structure of the coating is changed, such as a coating material and a coating thickness, reconstructed unstuck defect criteria need to be referred.

Description

technical field [0001] The invention relates to a method for judging defects of a wave-absorbing coating by using pulsed infrared thermal waves, and belongs to the technical field of non-destructive flaw detection. Background technique [0002] Because the wave-absorbing coating has the characteristics of thin thickness, large coating area, harsh use environment, and high performance requirements; defects such as pores and interface debonding may occur during the forming process. To ensure the quality of large-area coatings, it is necessary Conduct non-destructive testing of coatings. At present, the only methods for detecting the quality of absorbing coatings are visual inspection and tapping, etc., and it is urgent to find a fast and reliable detection method. Therefore, the non-destructive testing technology of absorbing coating is a blank. [0003] Pulse thermal imaging technology is one of the commonly used infrared thermal wave nondestructive testing technologies dev...

Claims

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Application Information

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IPC IPC(8): G01N21/88
Inventor 葛丽曾智伍颂朱军辉刘哲军程茶园李晓丽
Owner AEROSPACE RES INST OF MATERIAL & PROCESSING TECH
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