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A Test Platform for Hydrogen Frequency Scalar Subsystem

A test platform, hydrogen frequency standard technology, applied in the testing of machine/structural components, measuring electricity, measuring devices, etc., to achieve the effect of improving quality and efficiency, accurate measurement results, and comprehensive measurement performance

Inactive Publication Date: 2016-04-13
闫志鹏
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a test platform for the hydrogen frequency scalar subsystem to solve the problem of rapid measurement of the performance parameters of the hydrogen frequency scalar subsystem

Method used

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  • A Test Platform for Hydrogen Frequency Scalar Subsystem

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Embodiment Construction

[0025] The present invention will be further described below according to the accompanying drawings.

[0026] figure 1 It shows a test platform for a hydrogen-frequency scalar subsystem, which includes a first vacuum pump group 1, a second vacuum pump group 2, a vacuum chamber 3 for placing the radiation components of the measured subsystem, and a vacuum chamber for 3 Atomic beam optics for supplying the atomic beam 4, data processing unit 5 for processing data from the vacuum chamber and beam optics, first valve 6, second valve 7, first vacuum gauge 8, second vacuum gauge 9. A pipe 10 and at least one vacuum data interface 11 connecting the vacuum chamber and the beam optical system. The data processing unit includes a data processing module, a spectrum analyzer and a network analyzer. The first vacuum pump group 1 is connected to the vacuum chamber 3 through the first valve 6 , the first vacuum gauge 8 is connected to the vacuum chamber 3 , and the second vacuum pump group...

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Abstract

The invention relates to a test platform for a hydrogen frequency scalar subsystem. The test platform comprises a vacuum chamber used for enabling a radiation assembly of the subsystem to be measured to be fixed, a first vacuum gauge communicated with the vacuum chamber, at least one vacuum data interface used for outputting radiation signals to be measured and formed in the vacuum chamber, an atomic beam optical system used for supplying atomic beams to the vacuum chamber, a second vacuum gauge communicated with the atomic beam optical system, at least one vacuum pump set used for vacuumizing the vacuum chamber and the atomic beam optical system and a data processing unit used for processing data of the vacuum chamber, the atomic beam optical system, the first vacuum gauge and the second vacuum gauge. The test platform for the hydrogen frequency scalar subsystem has the advantages that multiple parameters of an active hydrogen frequency scalar and a passive hydrogen frequency scalar can be measured, the measuring period is short, the accuracy is high, and a more convenient and more rapid measuring method is offered to the improvement in hydrogen frequency scalar performance.

Description

technical field [0001] The invention relates to a measuring device, in particular to a test platform for a hydrogen frequency scalar subsystem. Background technique [0002] The hydrogen frequency standard has a very high frequency stability index, and is widely used in satellite navigation, time synchronization, punctuality and communication and other fields. Hydrogen frequency standards are divided into active hydrogen frequency standards and passive hydrogen frequency standards. The working principles of these two hydrogen frequency standards are different. The active hydrogen frequency standard can actively radiate the oscillation signal of hydrogen atoms, while the passive hydrogen frequency standard radiates the transition signal of hydrogen atoms under the excitation of external microwave signals. The index of the active hydrogen frequency standard is slightly higher than that of the passive hydrogen frequency standard, but it is higher than the passive hydrogen freq...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01M99/00G01N7/04
Inventor 陈海波
Owner 闫志鹏
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