Improved shutter delay measurement system
A measurement system and shutter technology, applied in optics, instruments, photography, etc., can solve the problems of out-of-sync exposure and achieve the effect of improving the accuracy of readings and reducing the complexity of readings
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0017] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.
[0018] An improved shutter delay measurement system of the present invention such as image 3 As shown, the system is composed of a camera to be tested 1, a controllable switch 2, a central processing unit 3 and a control display module 4, the central processing unit 3 contains an analog-to-digital converter AD and a counter T, and the controllable switch 2 is located in the camera to be tested 1 between the shutter line and the central processing unit 3, the central processing unit 3 is connected to the control display module 4, the analog-to-digital converter AD is connected to the exposure synchronous signal end of the camera 1 to be tested, and the control display module 4 sends a photographing instruction, and the cen...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com