Automatic cleaning device

Abstract

The invention discloses an automatic cleaning device. The automatic cleaning device comprises a chassis, wherein a cleaning area is arranged on the top surface of the chassis, the center of the top portion of the chassis is connected with an electromagnetic base, the top portion of the electromagnetic base is connected with a rotary cylinder, the output shaft on the top of the rotary cylinder is connected with a rotary base plate, a linear guide rail is horizontally arranged on the top surface of the rotary base plate, a machine head fixing frame is arranged on the linear guide rail, a motor fixing frame is fixedly arranged at the right end of the top portion of the rotary base plate, a first stepping motor is arranged on the motor fixing frame, the output shaft of the first stepping motor is connected with a feed lead screw, the feed lead screw is arranged at the left end of the top portion of the machine head fixing frame, a cleaning machine head is arranged on the bottom of the left end of the machine head fixing frame, and the cleaning machine head is connected with the feed lead screw. The automatic cleaning device has the advantages that foreign matter on the surfaces of devices to be cleaned such as multilayer ceramic capacitor testing equipment can be effectively removed fast and automatically, the cleanness of the surfaces of the devices to be cleaned is guaranteed, and the working efficiency of the devices to be cleaned is improved.

Description

technical field [0001] The invention relates to the technical field of production cleaning, in particular to an automatic cleaning device. Background technique [0002] At present, in the production process of multi-layer ceramic capacitors (Multi-layer ceramic capacitors), as many as 13 production processes need to go through, including Power (synthesis) engineering, Slurry engineering, forming engineering, printing engineering, lamination engineering, pressing Welding process, cutting process, firing process, grinding process, external electrode process, plating process, measurement process and appearance process. [0003] Among them, in the measurement project, the chip multilayer ceramic capacitor needs to be tested for point characteristics on the test equipment for electrical characteristics. During the uninterrupted testing process, a large amount of foreign matter will be generated on the contact surface between the electrode of the test equipment and the chip mult...

AI Technical Summary

Problems solved by technology

When the foreign matter reaches a certain level, it will cause the test equipment to be abnormal, and it is impossible to accurately test the performance of chip multilayer ceramic capacitors

At present, it is usually cleaned by manual cleaning, which not only reduces the work efficiency and increases unnecessary labor costs, but also seriously affects the test efficiency of the test equipment.

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