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Deconvolution-based double-optical path spectral measurement system

A spectrum measurement, dual optical path technology, applied in the field of spectrum measurement, can solve the problems of limited application, application range use, inability to detect signals, etc., to achieve the effect of a wide range of applications

Active Publication Date: 2013-06-12
NANJING UNIV OF SCI & TECH
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Problems solved by technology

In order to achieve the ideal high resolution, the slit width must be narrow enough, and the too narrow slit severely limits the energy of the light source entering the system and cannot obtain the ideal signal-to-noise ratio, and sometimes even cannot detect the signal at all, which results in Spectral resolution and system light flux have become a pair of contradictory quantities, which limits its application in low light
[0004] Chinese patent application 201210085114.1 discloses a "grating imaging spectrometer". Since this solution does not overcome the deficiency of obtaining the light source spectrum directly after dispersion by placing a narrow slit in the front section of the existing spectral measurement system, in order to directly The slit of the light source spectrum must be narrow, resulting in low back-end energy, which requires high detection capability of the detector, or requires the measured light source to have a strong energy, which limits its application range and cannot be used in night vision and biological systems with weak light. Medical and other occasions
[0005] In the article "Integrated Design of Imaging Spectrometer" published in Spectroscopy and Spectral Analysis [J].2012, 32(3), Cui Jicheng et al. explained that taking a convex grating imaging spectrometer as an example, using the existing typical Offner optical path structure, Obtain a method for the integrated design of imaging spectrometers. Although this method has a positive effect on solving the problem of optical aberration correction, it still does not overcome the existing shortcomings of directly obtaining spectra on imaging devices through a narrow slit, which limits its Application range Can not obtain a high signal-to-noise ratio in low-light night vision, biomedical and other occasions

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Embodiment Construction

[0017] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0018] to combine figure 1 , a deconvolution-based dual-optical-path spectral measurement device proposed by the present invention, the device is set as a dual-optical-path structure, one optical path is the objective lens (1), the slit (2), the collimating mirror (3), the beam splitter A mirror (4), a dispersion element (5), a first converging lens (6) and a first CCD camera (7) are sequentially composed, and another optical path is a beam splitter (4), a second converging lens (8) and a CCD camera (9) composed in sequence; the external light source converges to the slit (2) through the objective lens (1), and the slit (2) is set at the focus of the objective lens (1) and the collimating lens (3), and passes through the slit ( 2) The light will become parallel light after passing through the collimating mirror (3). When the parallel...

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Abstract

The invention relates to a deconvolution-based double-optical path spectral measurement system. The system is characterized in that: the system is arranged as a double-optical path structure, one optical path is sequentially composed of an objective, a slit, a collimating lens, a beam splitter, a dispersing element, a first converging lens and a first CCD (Charge Coupled Device) camera, and the other optical path is sequentially composed of a beam splitter, a second converging lens and a CCD camera. Aimed at the key problem that the detection ability of the conventional slit-based spectrometer is limited under weak light, a wider slit is adopted as a substitute in order to increase the light throughput of the system, so that the system has better detection ability under weak light, and moreover, light source spectrum is acquired by calculating the deconvolution of the primary image of undispersed light and the image of dispersed light. The system can be widely applied in the fields of metallurgy, geology, chemical, pharmacy, environment and the like, and is particularly suitable for weak light cases, such as biomedicine and night vision, so the application range is wide.

Description

technical field [0001] The invention belongs to the technical field of spectrum measurement, in particular to a deconvolution-based dual optical path spectrum measurement device. Background technique [0002] A spectrometer is a spectroscopic system that can divide a target light source with a continuous spectrum into multiple narrow spectrum segments. Through the analysis of the target spectrum, the elements contained in the item can be measured. It is a common device for analyzing the structure and composition of substances and is widely used. In metallurgy, geology, chemical industry, medicine and environment and other fields. [0003] Currently, the most common spectroscopic systems are slit-based spectrometers whose spectral resolution is directly related to the slit width. In order to achieve the ideal high resolution, the slit width must be narrow enough, and the too narrow slit severely limits the energy of the light source entering the system and cannot obtain the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28G01J3/02
Inventor 柏连发张毅陈钱顾国华岳江韩静
Owner NANJING UNIV OF SCI & TECH
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