Multiple-reflection high resolution time-of-flight mass spectrometer

Abstract

The invention provides a multiple-reflection high resolution time-of-flight mass spectrometer which comprises an ion source, an accelerator, a reflector set, a compensating reflector and a prober. Ions produced by the ion source are accelerated by the accelerator and reach the reflector set. After being reflected in the reflector set, the ions reach the compensating reflector, and after being reflected by the compensating reflector, the ions are detected by the prober. The accelerator adopts double-field acceleration, and therefore dispersive ions in space simultaneously focus to a certain place. Unlimited reflection of the ions is achieved by placing two opposite reflectors with the same focal length and without a grid mesh. The multiple-reflection high resolution time-of-flight mass spectrometer can be applied for mass spectrum analysis. The ions are reflected back and forth in a set of reflectors, and meanwhile the ions do not disperse by using a self-focusing function of the reflectors without the mesh, and therefore flight time is greatly prolonged and flexibility of the instrument is improved.

Description

technical field [0001] The invention belongs to the field of mass spectrometry, in particular to a high-resolution time-of-flight mass spectrometer with multiple reflections. Background technique [0002] Time of Flight Mass Spectrometer (TOF) is a commonly used mass spectrometry instrument. This mass spectrometer is mainly composed of an accelerator, a flight tube, and a microchannel plate detector (MCP). The ions generated by the ion source are accelerated into the field-free flight tube and fly to the MCP at a constant speed. The larger the ion mass, the longer the time it takes to reach the MCP, and the smaller the ion mass, the shorter the time it takes to reach the MCP. According to this principle, ions of different masses can be separated according to the mass-to-charge ratio (m / z). [0003] Because the difference in the initial position of ions will affect the flight time, the dual-field acceleration technology is generally used in the current time-of-flight mass s...

AI Technical Summary

Problems solved by technology

However, the current multiple reflection time-of-flight mass spectrometer ions will continue to disperse as the number of reflections increases, so it is difficult to further increase the number of reflections; at the same time, the traditional multiple reflection time-of-flight mass spectrometry ions cannot converge, so the ions cannot be separated for subsequent use. , which is exactly what is needed in many scientific research instruments

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