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Angle measuring device and angle measuring method of double-frequency laser interferometer based on slow-light material

A technology of dual-frequency laser interference and angle measurement device, which is applied to measurement devices, optical devices, instruments, etc., can solve problems such as low angle detection sensitivity, and achieve the effects of improved detection sensitivity and high detection sensitivity.

Inactive Publication Date: 2012-07-11
HARBIN INST OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The present invention aims to solve the problem of low angle detection sensitivity of the existing dual-frequency laser interferometer angle measurement device, thereby providing a dual-frequency laser interferometer angle measurement device and measurement method based on slow-light materials

Method used

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  • Angle measuring device and angle measuring method of double-frequency laser interferometer based on slow-light material
  • Angle measuring device and angle measuring method of double-frequency laser interferometer based on slow-light material
  • Angle measuring device and angle measuring method of double-frequency laser interferometer based on slow-light material

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specific Embodiment approach 1

[0021] Specific implementation mode 1. Combination image 3 and Figure 4 Illustrate this specific embodiment, the angle measurement device based on the dual-frequency laser interferometer of slow-light material, it comprises double-module assembly 1, double-angle pyramidal prism group 2, depolarizer 3 and photodetector 4, described double-module assembly 1 includes a polarizing beam splitter 1-1 and a common corner reflector 1-2, and the common corner reflector 1-2 is located above the polarizing beam splitter 1-1; the double corner cube prism group 2 includes a corner cube prism 2 -1 and No. 2 corner cube prism 2-2; Described No. 2 corner cube prism 2-2 is positioned at the top of No. 1 corner cube prism 2-1); It also comprises slow light material 6, and described slow light material 6 is arranged on No. 2 corner The mirror front of axicon prism 2-2;

[0022] The dual-frequency laser emitted by the dual-frequency laser interferometer is incident on the polarization beam sp...

specific Embodiment approach 2

[0031] Embodiment 2. The difference between this embodiment and the dual-frequency laser interferometer angle measuring device based on slow-light material described in Embodiment 1 is that the refractive index of the slow-light material 6 is 5.

[0032] The sensitivity of this embodiment is increased by 10 times, and this embodiment is suitable for electromagnetic induction transparency technology and spectral hole burning technology.

specific Embodiment approach 3

[0033] Specific embodiment three, using the angle measurement method of the dual-frequency laser interferometer based on the slow-light material of the specific embodiment one,

[0034] Fix the double-angle pyramidal prism group 2 on the object to be measured, so that it and the object to be measured are kept in a state of synchronous motion;

[0035] A dual-frequency laser interferometer is used to send a dual-frequency laser to enter the polarization beam splitter 1-1, and then collect the light intensity signal received by the photodetector 4,

[0036] According to the formula:

[0037] θ = sin - 1 Δ R = sin - 1 ∫ Δvdt R

[0038] Calculate and obtain the swing angle of the double-corner pyramid prism group (2), a...

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Abstract

The invention provides an angle measuring device and an angle measuring method of a double-frequency laser interferometer based on a slow-light material, which relates to an angle measuring device and an angle measuring method of the double-frequency laser interferometer. The angle measuring device provided by the invention aims at solving the problem of low angle measuring sensitivity of the angle measuring device of the existing double-frequency laser interferometer. Double-frequency laser is divided into polarized light with frequency at v1 and polarized light with frequency at v2 through a polarization spectroscope in a polarization direction. The polarized light with the frequency at v1 enters a pyramid prism 1 to be reflected to the polarization spectroscope through the pyramid prism 1; the polarized light with the frequency at v2 is reflected to the slow-light material sequentially through a common corner reflector, the slow-light material and a pyramid prism 2 and then is reflected to the polarization spectroscope sequentially through the slow-light material and the common corner reflector to converge with polarized light reflected through the pyramid prism 1 at the position of the polarization spectroscope so as to form beat frequency; and converged light enters an optical detection face of a photoelectric detector after being subjected to transmission of a polarization reducing device. The angle measuring device and the angle measuring method provided by the invention are applicable to the electromagnetic induction transparency technology and the spectral hole burning technology.

Description

technical field [0001] The invention relates to an angle measuring device and a measuring method of a dual-frequency laser interferometer. Background technique [0002] The dual-frequency laser interferometer not only has high measurement accuracy, but also has good anti-interference ability, and can be used for precise angle measurement. The speed of light propagating in a vacuum is constant, while the speed of light propagating in a medium is related to the refractive index (dispersion) of the medium. The higher the refractive index, the slower the propagation speed. [0003] At present, the device and principle of angle measurement of dual-frequency laser interferometer are as follows: figure 1 and figure 2 As shown, the dual-frequency laser emitted by the dual-frequency laser interferometer is expanded by the beam expander, and then divided into two beams according to the polarization direction by the polarization beam splitter at the lower part of the dual-module com...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/26G01B9/02
Inventor 刘炳国刘国栋宫娜浦昭邦陈凤东胡涛庄志涛
Owner HARBIN INST OF TECH
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