Multi-piece area array CCD (Charge Coupled Device) screening test system

Abstract

The utility model relates to a multi-piece area array CCD (Charge Coupled Device) screening test system which is used for solving the problems that when being in the temperature circulation and power aging screening test, the existing area array CCD works continuously and the test period is long. When the system is used for shooting, the image data of each piece of area array CCD is integrated by taking every four pieces as a unit, so that the number of input data channels is reduced to be one fourth that of the original chips, the input data channels are stored in an SDRAM (Synchronous Dynamic Random Access Memory) in parallel, and after the shooting is finished, the image data is read channel by channel and stored in a hard disk of a host by a capture card so as to be distinguished. According to the multi-piece area array CCD screening test system, effective signals of the input and output image data are reconstructed, and a line blanking period and a frame blanking period are utilized fully so as to reduce the writing and reading frequencies; and three clock domains, two groups of asynchronous FIFO (First In First Out) and two groups of deserializers and serializers are adopted for realizing non-integer-time stable and reliable conversion of image data bits under the condition of high speed.

Description

technical field [0001] The invention relates to a screening and testing system for a multi-chip area array CCD, in particular to a screening and testing system for a multi-chip area array CCD in a high-speed working mode. Background technique [0002] With the rapid development of aerospace technology and the continuous improvement of the technical level of microelectronic devices, the existing aerospace-grade devices can no longer meet the increasing performance requirements of spacecraft, and high-performance commercial devices are gradually being widely used. However, commercial devices have certain defects in space adaptability, which will bring certain risks to spacecraft and become a bottleneck in their space applications, and reliability screening must be carried out. The basic methods of reliability screening include high temperature storage, temperature cycling and power aging. [0003] Area array CCD is a key device in the field of remote sensing. Commercial area ...

AI Technical Summary

Problems solved by technology

[0005] The present invention solves the problems of the existing area array CCD in the temperature cycle and power aging screening tests that the area array CCD works continuously and has a long test period, and aims at the characteristics of collecting and outputting images in a fixed time period for judgment, and provides A Screening and Testing Method for Multi-Slice Array CCD

Images