Physical layer test system and method based on ARM (advanced RISC (reduced instruction set computer) machine) and DSP (digital signal processing) multi-core structure
A test system and physical layer technology, applied in electrical components, wireless communication, wireless network protocols, etc., can solve problems such as strong dependence on protocol codes, inability to verify system reliability and real-time performance, and inability to realize large-scale automated regression testing, etc. , to achieve the effect of reducing test cost, shortening development and test time, and convenient and quick automated regression test
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[0038] In order to make the purpose, technical solution and advantages of the present invention clearer, a physical layer test system and method based on ARM and DSP multi-core structure of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0039] A kind of physical layer testing system based on ARM and DSP multi-core structure of the present invention, as figure 1 shown, including:
[0040] The control device is used to connect the terminal under test, the signal source and the vector signal analyzer, which further includes:
[0041] The signal source control device is used to control the signal source according to the needs of the test case;
[0042] The data analysis module is used to realize the analysis of the uplink data;
[0043] The serial port driver module is used to realize the control and management of the serial port;
[0044] The main control module realizes the control of the test p...
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